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C. Dua: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. S. L. Delage, C. Dua
    Wide band gap semiconductor reliability : Status and trends. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1705-1712 [Journal]
  2. A. Sozza, C. Dua, A. Kerlain, C. Brylinski, E. Zanoni
    Long-term reliability of Ti-Pt-Au metallization system for Schottky contact and first-level metallization on SiC MESFET. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:7, pp:1109-1113 [Journal]
  3. A. Sozza, C. Dua, E. Morvan, B. Grimber, S. L. Delage
    A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1617-1621 [Journal]
  4. A. Sozza, A. Curutchet, C. Dua, N. Malbert, N. Labat, A. Touboul
    AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1725-1730 [Journal]

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