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J. P. Xu:
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Publications of Author
- David C. T. Or, P. T. Lai, J. K. O. Sin, Paul C. K. Kwok, J. P. Xu
Enhanced reliability for low-temperature gate dielectric of MOS devices by N2O or NO plasma nitridation. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:1, pp:163-166 [Journal]
- P. T. Lai, J. P. Xu, H. P. Wu, C. L. Chan
Interfacial properties and reliability of SiO2 grown on 6H-SiC in dry O2 plus trichloroethylene. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2004, v:44, n:4, pp:577-580 [Journal]
- X. Zou, J. P. Xu, C. X. Li, P. T. Lai, W. B. Chen
A threshold-voltage model of SiGe-channel pMOSFET without Si cap layer. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2007, v:47, n:2-3, pp:391-394 [Journal]
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