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Timothy D. Sullivan:
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Publications of Author
- Harry A. Schafft, Linda M. Head, Jason Gill, Timothy D. Sullivan
Early reliability assessment by using deep censoring. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:1, pp:1-16 [Journal]
- Baozhen Li, Timothy D. Sullivan, Tom C. Lee, Dinesh Badami
Reliability challenges for copper interconnects. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2004, v:44, n:3, pp:365-380 [Journal]
- Baozhen Li, Emmanuel Yashchin, Cathryn Christiansen, Jason Gill, Ronald Filippi, Timothy D. Sullivan
Application of three-parameter lognormal distribution in EM data analysis. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:12, pp:2049-2055 [Journal]
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