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E. Beyne:
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Publications of Author
- P. Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, E. Beyne
Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1785-1790 [Journal]
- K. Baert, Bert Gyselinckx, T. Torfs, V. Leonov, F. Yazicioglu, S. Brebels, S. Donnay, J. Vanfletern, M. Pastreen, E. Beyne, C. Van Hoof
Technologies for highly miniaturized autonomous sensor networks. [Citation Graph (0, 0)][DBLP] Microelectronics Journal, 2006, v:37, n:12, pp:1563-1568 [Journal]
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