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Johnny K. O. Sin: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Xiangbin Zeng, X. W. Sun, Junfeng Li, Johnny K. O. Sin
    Improving reliability of poly-Si TFTs with channel layer and gate oxide passivated by NH3/N2O plasma. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:3, pp:435-442 [Journal]
  2. Xiangbin Zeng, X. W. Sun, Johnny K. O. Sin
    Improving hydrogenation efficiency of polycrystalline silicon thin film transistors by a new approach. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2003, v:34, n:11, pp:1079-1085 [Journal]

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