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S. Lefebvre: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Z. Khatir, S. Lefebvre
    Boundary element analysis of thermal fatigue effects on high power IGBT modules. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:6, pp:929-938 [Journal]
  2. L. Dupont, Z. Khatir, S. Lefebvre, S. Bontemps
    Effects of metallization thickness of ceramic substrates on the reliability of power assemblies under high temperature cycling. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1766-1771 [Journal]
  3. Z. Khatir, S. Lefebvre, F. Saint-Eve
    Experimental and numerical investigations on delayed short-circuit failure mode of single chip IGBT devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2007, v:47, n:2-3, pp:422-428 [Journal]

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