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Thomas Zimmer: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Hassène Mnif, Thomas Zimmer, Jean Luc Battaglia, Sébastien Fregonese
    Representation of the SiGe HBT's thermal impedance by linear and recursive networks. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:6, pp:945-950 [Journal]
  2. Yvan Maidon, Thomas Zimmer, André Ivanov
    An Analog Circuit Fault Characterization Methodology. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:2, pp:127-134 [Journal]

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