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Yider Wu: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Yi-Mu Lee, Yider Wu, Gerald Lucovsky
    Breakdown and reliability of p-MOS devices with stacked RPECVD oxide/nitride gate dielectric under constant voltage stress. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:2, pp:207-212 [Journal]

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