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J. C. Vildeuil:
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Publications of Author
- M. Marin, Y. Akue Allogo, M. de Murcia, P. Llinares, J. C. Vildeuil
Low frequency noise characterization in 0.13 mum p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 mum technologies on 1/f noise. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2004, v:44, n:7, pp:1077-1085 [Journal]
- P. Benoit, J. Raoult, C. Delseny, F. Pascal, L. Snadny, J. C. Vildeuil, M. Marin, B. Martinet, D. Cottin, O. Noblanc
Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:9-11, pp:1800-1806 [Journal]
- C. Leyris, F. Martinez, A. Hoffmann, M. Valenza, J. C. Vildeuil
N-MOSFET oxide trap characterization induced by nitridation process using RTS noise analysis. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2007, v:47, n:1, pp:41-45 [Journal]
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