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Q. Kan: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Y. C. Chou, D. Leung, I. Smorchkova, M. Wojtowicz, R. Grundbacher, L. Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng
    Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:7, pp:1033-1038 [Journal]
  2. Y. C. Chou, D. Leung, R. Grundbacher, R. Lai, Q. Kan, P. H. Liu, D. Eng, T. Block, A. Oki
    Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:1, pp:24-40 [Journal]

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