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S. G. Mhaisalkar:
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Publications of Author
- A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy
Electromigration behavior of dual-damascene Cu interconnects--Structure, width, and length dependences. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2004, v:44, n:5, pp:747-754 [Journal]
- H. S. Nguyen, Z. H. Gan, Zhe Chen, V. Chandrasekar, K. Prasad, S. G. Mhaisalkar, Ning Jiang
Reliability studies of barrier layers for Cu/PAE low-k interconnects. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:8, pp:1309-1314 [Journal]
- M. Y. Yan, K. N. Tu, A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy
A direct measurement of electromigration induced drift velocity in Cu dual damascene interconnects. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:8, pp:1392-1395 [Journal]
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