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Ahila Krishnamoorthy: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy
    Electromigration behavior of dual-damascene Cu interconnects--Structure, width, and length dependences. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:5, pp:747-754 [Journal]
  2. M. Y. Yan, K. N. Tu, A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy
    A direct measurement of electromigration induced drift velocity in Cu dual damascene interconnects. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:8, pp:1392-1395 [Journal]

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