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L. Pantisano:
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Publications of Author
- J. Pétry, W. Vandervorst, L. Pantisano, Robin Degraeve
On the data interpretation of the C-AFM measurements in the characterization of thin insulating layers. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:5-6, pp:815-818 [Journal]
- W. Deweerd, V. Kaushik, J. Chen, Y. Shimamoto, T. Schram, L.-Å. Ragnarsson, A. Delabie, L. Pantisano, B. Eyckens, J. W. Maes
Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:5-6, pp:786-789 [Journal]
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