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Heinrich Wolf: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Heinrich Wolf, Horst A. Gieser, Wolfgang Stadler, Wolfgang Wilkening
Capacitively coupled transmission line pulsing cc-TLP--a traceable and reproducible stress method in the CDM-domain. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:2, pp:279-285 [Journal] - S. Bargstädt-Franke, Wolfgang Stadler, K. Esmark, M. Streibl, K. Domanski, Horst A. Gieser, Heinrich Wolf, W. Bala
Transient latch-up: experimental analysis and device simulation. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:2, pp:297-304 [Journal] - Heinrich Wolf, Horst A. Gieser, Wolfgang Soldner, Harald Gossner
A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:9-11, pp:1421-1424 [Journal] - Heinrich Wolf, Horst A. Gieser, Detlef Bonfert, Markus Hauser
ESD Susceptibility of Submicron Air Gaps. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2006, v:46, n:9-11, pp:1587-1590 [Journal] - Detlef Bonfert, Horst A. Gieser, Heinrich Wolf, M. Frank, A. Konrad, J. Schulz
Transient-induced latch-up test setup for wafer-level and package-level. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2006, v:46, n:9-11, pp:1629-1633 [Journal]
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