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T. Schram:
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Publications of Author
- W. Deweerd, V. Kaushik, J. Chen, Y. Shimamoto, T. Schram, L.-Å. Ragnarsson, A. Delabie, L. Pantisano, B. Eyckens, J. W. Maes
Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:5-6, pp:786-789 [Journal]
- T. Schram, L.-Å. Ragnarsson, G. Lujan, W. Deweerd, J. Chen, W. Tsai, K. Henson, R. J. P. Lander, J. C. Hooker, J. Vertommen
Performance improvement of self-aligned HfO2/TaN and SiON/TaN nMOS transistors. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:5-6, pp:779-782 [Journal]
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