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Akitaka Yoshigoe: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Shinji Fujieda, Yoshinao Miura, Motofumi Saitoh, Yuden Teraoka, Akitaka Yoshigoe
    Characterization of interface defects related to negative-bias temperature instability in ultrathin plasma-nitrided SiON/Si<1 0 0> systems. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:1, pp:57-64 [Journal]

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