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A. Benmansour: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. S. Azzopardi, A. Benmansour, M. Ishiko, E. Woirgard
    Assessment of the Trench IGBT reliability: low temperature experimental characterization. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1700-1705 [Journal]
  2. A. Benmansour, S. Azzopardi, J. C. Martin, E. Woirgard
    Failure mechanism of trench IGBT under short-circuit after turn-off. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1778-1783 [Journal]

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