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Uwe Kerst: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Rudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit
    Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1544-1549 [Journal]
  2. Rudolf Schlangen, Peter Sadewater, Uwe Kerst, Christian Boit
    Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1498-1503 [Journal]

  3. Physical Techniques for Chip-Backside IC Debug in Nanotechnologies. [Citation Graph (, )][DBLP]


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