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S. J. C. H. Theeuwen:
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- N. Nenadovic, V. Cuoco, S. J. C. H. Theeuwen, L. K. Nanver, H. Schellevis, G. Spierings, H. F. F. Jos, J. W. Slotboom
Electrothermal characterization of silicon-on-glass VDMOSFETs. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:3-4, pp:541-550 [Journal]
- P. J. van der Wel, S. J. C. H. Theeuwen, J. A. Bielen, Y. Li, R. A. van den Heuvel, J. G. Gommans, F. van Rijs, P. Bron, H. J. F. Peuscher
Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:8, pp:1279-1284 [Journal]
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