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Longxing Shi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Luo Chun, Yang Jun, Gao Gugang, Shi Longxing
    Domain fault model and coverage metric for SoC verification. [Citation Graph (0, 0)][DBLP]
    ISCAS (6), 2005, pp:5662-5665 [Conf]
  2. Luo Chun, Yang Jun, Shi Longxing, Wu XuFan, Zhang Yu
    Domain Strategy and Coverage Metric for Validation. [Citation Graph (0, 0)][DBLP]
    ISQED, 2005, pp:40-45 [Conf]
  3. Weifeng Sun, Longxing Shi
    Improving the yield and reliability of the bulk-silicon HV-CMOS by adding a P-well. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:1, pp:185-190 [Journal]
  4. Zhilin Sun, Weifeng Sun, Yangbo Yi, Longxing Shi
    Study of the power capability of LDMOS and the improved methods. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:5-6, pp:1001-1005 [Journal]
  5. Zhilin Sun, Weifeng Sun, Longxing Shi
    A review of safe operation area. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:7, pp:661-667 [Journal]
  6. Bu Aiguo, Shi Longxing, Hu Chen, Li Jie, Wang Chao
    Energy-optimal dynamic voltage scaling for sporadic tasks. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2006, pp:- [Conf]

  7. Area-efficient line-based two-dimensional discrete wavelet transform architecture without data buffer. [Citation Graph (, )][DBLP]

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