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Kok Tong Tan: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Cher Ming Tan, Arijit Roy, Kok Tong Tan, Derek Sim Kwang Ye, Frankie Low
    Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1449-1454 [Journal]
  2. Cher Ming Tan, Wei Li, Kok Tong Tan, Frankie Low
    Development of highly accelerated electromigration test. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1638-1642 [Journal]

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