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T. L. Alford: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. E. Misra, Md M. Islam, Mahbub Hasan, H. C. Kim, T. L. Alford
    Percolative approach for failure time prediction of thin film interconnects under high current stress. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:2, pp:391-395 [Journal]
  2. E. Misra, N. D. Theodore, J. W. Mayer, T. L. Alford
    Failure mechanisms of pure silver, pure aluminum and silver-aluminum alloy under high current stress. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:12, pp:2096-2103 [Journal]

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