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Kenneth Wu: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Ling-Chang Hu, An-Chi Kang, Eric Chen, J. R. Shih, Yao-Feng Lin, Kenneth Wu, Ya-Chin King
    Gate stress effect on low temperature data retention characteristics of split-gate flash memories. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1331-1336 [Journal]
  2. Robin C. J. Wang, C. C. Lee, L. D. Chen, Kenneth Wu, K. S. Chang-Liao
    A study of Cu/Low-k stress-induced voiding at via bottom and its microstructure effect. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1673-1678 [Journal]
  3. Kimberle Koile, Kevin Chevalier, Michel Rbeiz, Adam Rogal, David Singer, Jordan Sorensen, Amanda Smith, Kah Seng Tay, Kenneth Wu
    Supporting Feedback and Assessment of Digital Ink Answers to In-Class Exercises. [Citation Graph (0, 0)][DBLP]
    AAAI, 2007, pp:1787-1794 [Conf]

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