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S. Mettler: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Wolfgang Stadler, K. Esmark, K. Reynders, M. Zubeidat, M. Graf, Wolfgang Wilkening, J. Willemen, N. Qu, S. Mettler, M. Etherton
    Test circuits for fast and reliable assessment of CDM robustness of I/O stages. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:2, pp:269-277 [Journal]
  2. M. Etherton, N. Qu, J. Willemen, Wolfgang Wilkening, S. Mettler, M. Dissegna, R. Stella, L. Zullino, A. Andreini, Horst A. Gieser
    Study of CDM specific effects for a smart power input protection structure. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:5-6, pp:666-676 [Journal]

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