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Christian Burmer: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Christian Burmer, Siegfried Görlich
    Failure analyses for debug and ramp-up of modern IC's. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1486-1497 [Journal]
  2. Liming Gao, Christian Burmer, Frank Siegelin
    ATPG scan logic failure analysis: a case study of logic ICs - fault isolation, defect mechanism identification and yield improvement. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1458-1463 [Journal]

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