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Tsung-Min Chang: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. You-Lin Wu, Shi-Tin Lin, Tsung-Min Chang, Juin J. Liou
    Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2007, v:47, n:2-3, pp:419-421 [Journal]

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