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Bee-San Teo: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Kah-Yoong Chan, Bee-San Teo
    Atomic force microscopy (AFM) and X-ray diffraction (XRD) investigations of copper thin films prepared by dc magnetron sputtering technique. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:10, pp:1064-1071 [Journal]
  2. Kah-Yoong Chan, Teck-Yong Tou, Bee-San Teo
    Thickness dependence of the structural and electrical properties of copper films deposited by dc magnetron sputtering technique. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:7, pp:608-612 [Journal]
  3. Kah-Yoong Chan, Teck-Yong Tou, Bee-San Teo
    Effects of substrate temperature on electrical and structural properties of copper thin films. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:9, pp:930-937 [Journal]

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