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Sun Hai Qin: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Sohan Singh Mehta, Sun Hai Qin, Moitreyee Mukherjee-Roy, Navab Singh, Rakesh Kumar
    Resist pattern peeling assessment in DUV chemically amplified resist. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2004, v:35, n:5, pp:427-429 [Journal]

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