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B. Zhao: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. H. Zhou, F. G. Shi, B. Zhao, J. Yota
    Effect of deposition methods on dielectric breakdown strength of PECVD low-k carbon doped silicon dioxide dielectric thin films. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2004, v:35, n:7, pp:571-576 [Journal]
  2. H. Zhou, F. G. Shi, B. Zhao
    Thickness dependent dielectric breakdown of PECVD low-k carbon doped silicon dioxide dielectric thin films: modeling and experiments. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2003, v:34, n:4, pp:259-264 [Journal]

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