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Kanak Agarwal: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Mridul Agarwal, Kanak Agarwal, Dennis Sylvester, David Blaauw
    Statistical modeling of cross-coupling effects in VLSI interconnects. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2005, pp:503-506 [Conf]
  2. Kanak Agarwal, Yu Cao, Takashi Sato, Dennis Sylvester, Chenming Hu
    Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2002, pp:77-86 [Conf]
  3. Kanak Agarwal, Dennis Sylvester, David Blaauw
    A simplified transmission-line based crosstalk noise model for on-chip RLC wiring. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2004, pp:858-864 [Conf]
  4. Kanak Agarwal, Dennis Sylvester, David Blaauw, Anirudh Devgan
    Achieving continuous VT performance in a dual VT process. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2005, pp:393-398 [Conf]
  5. Kanak Agarwal, Sani R. Nassif
    Statistical analysis of SRAM cell stability. [Citation Graph (0, 0)][DBLP]
    DAC, 2006, pp:57-62 [Conf]
  6. Kanak Agarwal, Dennis Sylvester, David Blaauw
    An effective capacitance based driver output model for on-chip RLC interconnects. [Citation Graph (0, 0)][DBLP]
    DAC, 2003, pp:376-381 [Conf]
  7. Kanak Agarwal, Dennis Sylvester, David Blaauw
    Simple metrics for slew rate of RC circuits based on two circuit moments. [Citation Graph (0, 0)][DBLP]
    DAC, 2003, pp:950-953 [Conf]
  8. Kanak Agarwal, Dennis Sylvester, David Blaauw, Frank Liu, Sani R. Nassif, Sarma B. K. Vrudhula
    Variational delay metrics for interconnect timing analysis. [Citation Graph (0, 0)][DBLP]
    DAC, 2004, pp:381-384 [Conf]
  9. Ashish Srivastava, Saumil Shah, Kanak Agarwal, Dennis Sylvester, David Blaauw, Stephen W. Director
    Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. [Citation Graph (0, 0)][DBLP]
    DAC, 2005, pp:535-540 [Conf]
  10. Shidhartha Das, Kanak Agarwal, David Blaauw, Dennis Sylvester
    Optimal Inductance for On-chip RLC Interconnections. [Citation Graph (0, 0)][DBLP]
    ICCD, 2003, pp:264-0 [Conf]
  11. Saumil Shah, Kanak Agarwal, Dennis Sylvester
    A New Threshold Voltage Assignment Scheme for Runtime Leakage Reduction in On-Chip Repeaters. [Citation Graph (0, 0)][DBLP]
    ICCD, 2004, pp:138-143 [Conf]
  12. Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Himanshu Kaul, Richard B. Brown, Sani R. Nassif
    Power-aware global signaling strategies. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2005, pp:604-607 [Conf]
  13. Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Richard B. Brown, Kevin J. Nowka, Sani R. Nassif
    Approaches to run-time and standby mode leakage reduction in global buses. [Citation Graph (0, 0)][DBLP]
    ISLPED, 2004, pp:188-193 [Conf]
  14. Kanak Agarwal, Kevin J. Nowka, Harmander Deogun, Dennis Sylvester
    Power Gating with Multiple Sleep Modes. [Citation Graph (0, 0)][DBLP]
    ISQED, 2006, pp:633-637 [Conf]
  15. Rahul M. Rao, Kanak Agarwal, Anirudh Devgan, Kevin J. Nowka, Dennis Sylvester, Richard B. Brown
    Parametric Yield Analysis and Constrained-Based Supply Voltage Optimization. [Citation Graph (0, 0)][DBLP]
    ISQED, 2005, pp:284-290 [Conf]
  16. Kanak Agarwal, Kevin J. Nowka
    Dynamic Power Management by Combination of Dual Static Supply Voltages. [Citation Graph (0, 0)][DBLP]
    ISQED, 2007, pp:85-92 [Conf]
  17. Kanak Agarwal, Dennis Sylvester, David Blaauw
    A library compatible driving point model for on-chip RLC interconnects. [Citation Graph (0, 0)][DBLP]
    Timing Issues in the Specification and Synthesis of Digital Systems, 2002, pp:63-69 [Conf]
  18. Kanak Agarwal, Yu Cao, Takashi Sato, Dennis Sylvester, Chenming Hu
    Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2002, pp:77-0 [Conf]
  19. Kanak Agarwal, Mridul Agarwal, Dennis Sylvester, David Blaauw
    Statistical interconnect metrics for physical-design optimization. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:7, pp:1273-1288 [Journal]
  20. Kanak Agarwal, Dennis Sylvester, David Blaauw
    A library compatible driver output model for on-chip RLC transmission lines. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:1, pp:128-136 [Journal]
  21. Kanak Agarwal, Dennis Sylvester, David Blaauw
    A simple metric for slew rate of RC circuits based on two circuit moments. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:9, pp:1346-1354 [Journal]
  22. Kanak Agarwal, Dennis Sylvester, David Blaauw
    Modeling and analysis of crosstalk noise in coupled RLC interconnects. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:5, pp:892-901 [Journal]
  23. Takashi Sato, Yu Cao, Kanak Agarwal, Dennis Sylvester, Chenming Hu
    Bidirectional closed-form transformation between on-chip coupling noise waveforms and interconnect delay-change curves. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:5, pp:560-572 [Journal]
  24. Kanak Agarwal, Sani R. Nassif
    Characterizing Process Variation in Nanometer CMOS. [Citation Graph (0, 0)][DBLP]
    DAC, 2007, pp:396-399 [Conf]
  25. Emrah Acar, Kanak Agarwal, Sani R. Nassif
    Characterization of total chip leakage using inverse (reciprocal) gamma distribution. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2006, pp:- [Conf]
  26. Sani R. Nassif, Kanak Agarwal, Emrah Acar
    Methods for estimating decoupling capacitance of nonswitching circuit blocks. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2006, pp:- [Conf]
  27. H. Singh, Kanak Agarwal, Dennis Sylvester, Kevin J. Nowka
    Enhanced Leakage Reduction Techniques Using Intermediate Strength Power Gating. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2007, v:15, n:11, pp:1215-1224 [Journal]
  28. Kanak Agarwal, Rahul M. Rao, Dennis Sylvester, Richard B. Brown
    Parametric Yield Analysis and Optimization in Leakage Dominated Technologies. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2007, v:15, n:6, pp:613-623 [Journal]

  29. Leakage power reduction using stress-enhanced layouts. [Citation Graph (, )][DBLP]


  30. Closed-form modeling of layout-dependent mechanical stress. [Citation Graph (, )][DBLP]


  31. Frequency domain decomposition of layouts for double dipole lithography. [Citation Graph (, )][DBLP]


  32. On-die sensors for measuring process and environmental variations in integrated circuits. [Citation Graph (, )][DBLP]


  33. Efficient computation of current flow in signal wires for reliability analysis. [Citation Graph (, )][DBLP]


  34. Characterizing within-die variation from multiple supply port IDDQ measurements. [Citation Graph (, )][DBLP]


  35. Stress aware layout optimization. [Citation Graph (, )][DBLP]


  36. A Design Model for Random Process Variability. [Citation Graph (, )][DBLP]


  37. The impact of BEOL lithography effects on the SRAM cell performance and yield. [Citation Graph (, )][DBLP]


  38. Simultaneous extraction of effective gate length and low-field mobility in non-uniform devices. [Citation Graph (, )][DBLP]


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