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## Search the dblp DataBase
Dennis Sylvester:
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## Publications of Author- Mridul Agarwal, Kanak Agarwal, Dennis Sylvester, David Blaauw
**Statistical modeling of cross-coupling effects in VLSI interconnects.**[Citation Graph (0, 0)][DBLP] ASP-DAC, 2005, pp:503-506 [Conf] - Kanak Agarwal, Yu Cao, Takashi Sato, Dennis Sylvester, Chenming Hu
**Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis.**[Citation Graph (0, 0)][DBLP] ASP-DAC, 2002, pp:77-86 [Conf] - Kanak Agarwal, Dennis Sylvester, David Blaauw
**A simplified transmission-line based crosstalk noise model for on-chip RLC wiring.**[Citation Graph (0, 0)][DBLP] ASP-DAC, 2004, pp:858-864 [Conf] - Kanak Agarwal, Dennis Sylvester, David Blaauw, Anirudh Devgan
**Achieving continuous V**[Citation Graph (0, 0)][DBLP]_{T}performance in a dual V_{T}process. ASP-DAC, 2005, pp:393-398 [Conf] - Matthew R. Guthaus, Dennis Sylvester, Richard B. Brown
**Process-induced skew reduction in nominal zero-skew clock trees.**[Citation Graph (0, 0)][DBLP] ASP-DAC, 2006, pp:84-89 [Conf] - Sarvesh H. Kulkarni, Dennis Sylvester
**Power distribution techniques for dual VDD circuits.**[Citation Graph (0, 0)][DBLP] ASP-DAC, 2006, pp:838-843 [Conf] - Dongwoo Lee, David Blaauw, Dennis Sylvester
**Runtime leakage minimization through probability-aware dual-Vt or dual-tox assignment.**[Citation Graph (0, 0)][DBLP] ASP-DAC, 2005, pp:399-404 [Conf] - Kanak Agarwal, Dennis Sylvester, David Blaauw
**An effective capacitance based driver output model for on-chip RLC interconnects.**[Citation Graph (0, 0)][DBLP] DAC, 2003, pp:376-381 [Conf] - Kanak Agarwal, Dennis Sylvester, David Blaauw
**Simple metrics for slew rate of RC circuits based on two circuit moments.**[Citation Graph (0, 0)][DBLP] DAC, 2003, pp:950-953 [Conf] - Kanak Agarwal, Dennis Sylvester, David Blaauw, Frank Liu, Sani R. Nassif, Sarma B. K. Vrudhula
**Variational delay metrics for interconnect timing analysis.**[Citation Graph (0, 0)][DBLP] DAC, 2004, pp:381-384 [Conf] - Andrew E. Caldwell, Yu Cao, Andrew B. Kahng, Farinaz Koushanfar, Hua Lu, Igor L. Markov, Michael Oliver, Dirk Stroobandt, Dennis Sylvester
**GTX: the MARCO GSRC technology extrapolation system.**[Citation Graph (0, 0)][DBLP] DAC, 2000, pp:693-698 [Conf] - Luigi Capodieci, Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, Jie Yang
**Toward a methodology for manufacturability-driven design rule exploration.**[Citation Graph (0, 0)][DBLP] DAC, 2004, pp:311-316 [Conf] - Harmander Deogun, Rajeev R. Rao, Dennis Sylvester, David Blaauw
**Leakage-and crosstalk-aware bus encoding for total power reduction.**[Citation Graph (0, 0)][DBLP] DAC, 2004, pp:779-782 [Conf] - Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Dennis Sylvester
**Advanced Timing Analysis Based on Post-OPC Extraction of Critical Dimensions.**[Citation Graph (0, 0)][DBLP] DAC, 2005, pp:365-368 [Conf] - Puneet Gupta, Andrew B. Kahng, Puneet Sharma, Dennis Sylvester
**Selective gate-length biasing for cost-effective runtime leakage control.**[Citation Graph (0, 0)][DBLP] DAC, 2004, pp:327-330 [Conf] - Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, Jie Yang
**A cost-driven lithographic correction methodology based on off-the-shelf sizing tools.**[Citation Graph (0, 0)][DBLP] DAC, 2003, pp:16-21 [Conf] - Matthew R. Guthaus, Dennis Sylvester, Richard B. Brown
**Clock buffer and wire sizing using sequential programming.**[Citation Graph (0, 0)][DBLP] DAC, 2006, pp:1041-1046 [Conf] - Eric Karl, David Blaauw, Dennis Sylvester, Trevor N. Mudge
**Reliability modeling and management in dynamic microprocessor-based systems.**[Citation Graph (0, 0)][DBLP] DAC, 2006, pp:1057-1060 [Conf] - Dongwoo Lee, Wesley Kwong, David Blaauw, Dennis Sylvester
**Analysis and minimization techniques for total leakage considering gate oxide leakage.**[Citation Graph (0, 0)][DBLP] DAC, 2003, pp:175-180 [Conf] - Sani R. Nassif, Vijay Pitchumani, N. Rodriguez, Dennis Sylvester, Clive Bittlestone, Riko Radojcic
**Variation-aware analysis: savior of the nanometer era?**[Citation Graph (0, 0)][DBLP] DAC, 2006, pp:411-412 [Conf] - Ruchir Puri, Leon Stok, John M. Cohn, David S. Kung, David Z. Pan, Dennis Sylvester, Ashish Srivastava, Sarvesh H. Kulkarni
**Pushing ASIC performance in a power envelope.**[Citation Graph (0, 0)][DBLP] DAC, 2003, pp:788-793 [Conf] - Jan M. Rabaey, Dennis Sylvester, David Blaauw, Kerry Bernstein, Jerry Frenkil, Mark Horowitz, Wolfgang Nebel, Takayasu Sakurai, Andrew Yang
**Reshaping EDA for power.**[Citation Graph (0, 0)][DBLP] DAC, 2003, pp:15- [Conf] - Rajeev R. Rao, Anirudh Devgan, David Blaauw, Dennis Sylvester
**Parametric yield estimation considering leakage variability.**[Citation Graph (0, 0)][DBLP] DAC, 2004, pp:442-447 [Conf] - Ashish Srivastava, Saumil Shah, Kanak Agarwal, Dennis Sylvester, David Blaauw, Stephen W. Director
**Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance.**[Citation Graph (0, 0)][DBLP] DAC, 2005, pp:535-540 [Conf] - Ashish Srivastava, Dennis Sylvester, David Blaauw
**Statistical optimization of leakage power considering process variations using dual-Vth and sizing.**[Citation Graph (0, 0)][DBLP] DAC, 2004, pp:773-778 [Conf] - Ashish Srivastava, Dennis Sylvester, David Blaauw
**Power minimization using simultaneous gate sizing, dual-Vdd and dual-Vth assignment.**[Citation Graph (0, 0)][DBLP] DAC, 2004, pp:783-787 [Conf] - Anup Kumar Sultania, Dennis Sylvester, Sachin S. Sapatnekar
**Tradeoffs between date oxide leakage and delay for dual T**[Citation Graph (0, 0)][DBLP]_{ox}circuits. DAC, 2004, pp:761-766 [Conf] - Dennis Sylvester, Himanshu Kaul
**Future Performance Challenges in Nanometer Design.**[Citation Graph (0, 0)][DBLP] DAC, 2001, pp:3-8 [Conf] - Jie Yang, Luigi Capodieci, Dennis Sylvester
**Advanced timing analysis based on post-OPC extraction of critical dimensions.**[Citation Graph (0, 0)][DBLP] DAC, 2005, pp:359-364 [Conf] - Bo Zhai, David Blaauw, Dennis Sylvester, Krisztián Flautner
**Theoretical and practical limits of dynamic voltage scaling.**[Citation Graph (0, 0)][DBLP] DAC, 2004, pp:868-873 [Conf] - Robert Bai, Nam Sung Kim, Taeho Kgil, Dennis Sylvester, Trevor N. Mudge
**Power-Performance Trade-Offs in Nanometer-Scale Multi-Level Caches Considering Total Leakage.**[Citation Graph (0, 0)][DBLP] DATE, 2005, pp:650-651 [Conf] - Himanshu Kaul, Dennis Sylvester, David Blaauw, Trevor N. Mudge, Todd M. Austin
**DVS for On-Chip Bus Designs Based on Timing Error Correction.**[Citation Graph (0, 0)][DBLP] DATE, 2005, pp:80-85 [Conf] - Dongwoo Lee, Harmander Deogun, David Blaauw, Dennis Sylvester
**Simultaneous State, Vt and Tox Assignment for Total Standby Power Minimization.**[Citation Graph (0, 0)][DBLP] DATE, 2004, pp:494-499 [Conf] - Rajeev R. Rao, Kaviraj Chopra, David Blaauw, Dennis Sylvester
**An efficient static algorithm for computing the soft error rates of combinational circuits.**[Citation Graph (0, 0)][DBLP] DATE, 2006, pp:164-169 [Conf] - Ashish Srivastava, Dennis Sylvester, David Blaauw
**Concurrent Sizing, Vdd and Vth Assignment for Low-Power Design.**[Citation Graph (0, 0)][DBLP] DATE, 2004, pp:718-719 [Conf] - Robert Bai, Nam Sung Kim, Dennis Sylvester, Trevor N. Mudge
**Total leakage optimization strategies for multi-level caches.**[Citation Graph (0, 0)][DBLP] ACM Great Lakes Symposium on VLSI, 2005, pp:381-384 [Conf] - Matthew R. Guthaus, Natesan Venkateswaran, Vladimir Zolotov, Dennis Sylvester, Richard B. Brown
**Optimization objectives and models of variation for statistical gate sizing.**[Citation Graph (0, 0)][DBLP] ACM Great Lakes Symposium on VLSI, 2005, pp:313-316 [Conf] - Himanshu Kaul, Dennis Sylvester
**A novel buffer circuit for energy efficient signaling in dual-VDD systems.**[Citation Graph (0, 0)][DBLP] ACM Great Lakes Symposium on VLSI, 2005, pp:462-467 [Conf] - Himanshu Kaul, Dennis Sylvester, David Blaauw
**Active shields: a new approach to shielding global wires.**[Citation Graph (0, 0)][DBLP] ACM Great Lakes Symposium on VLSI, 2002, pp:112-117 [Conf] - Yu Cao, Chenming Hu, Xuejue Huang, Andrew B. Kahng, Sudhakar Muddu, Dirk Stroobandt, Dennis Sylvester
**Effects of Global Interconnect Optimizations on Performance Estimation of Deep Submicron Design.**[Citation Graph (0, 0)][DBLP] ICCAD, 2000, pp:56-61 [Conf] - Yu Cao, Xiao-Dong Yang, Xuejue Huang, Dennis Sylvester
**Switch-Factor Based Loop RLC Modeling for Efficient Timing Analysis.**[Citation Graph (0, 0)][DBLP] ICCAD, 2003, pp:848-854 [Conf] - Kaviraj Chopra, Saumil Shah, Ashish Srivastava, David Blaauw, Dennis Sylvester
**Parametric yield maximization using gate sizing based on efficient statistical power and delay gradient computation.**[Citation Graph (0, 0)][DBLP] ICCAD, 2005, pp:1023-1028 [Conf] - Saumil Shah, Ashish Srivastava, Dushyant Sharma, Dennis Sylvester, David Blaauw, Vladimir Zolotov
**Discrete Vt assignment and gate sizing using a self-snapping continuous formulation.**[Citation Graph (0, 0)][DBLP] ICCAD, 2005, pp:705-712 [Conf] - Ashish Srivastava, Dennis Sylvester
**A general framework for probabilistic low-power design space exploration considering process variation.**[Citation Graph (0, 0)][DBLP] ICCAD, 2004, pp:808-813 [Conf] - Dennis Sylvester, Kurt Keutzer
**Getting to the bottom of deep submicron.**[Citation Graph (0, 0)][DBLP] ICCAD, 1998, pp:203-211 [Conf] - Rajeev R. Rao, David Blaauw, Dennis Sylvester
**Soft error reduction in combinational logic using gate resizing and flipflop selection.**[Citation Graph (0, 0)][DBLP] ICCAD, 2006, pp:502-509 [Conf] - Sarvesh H. Kulkarni, Dennis Sylvester, David Blaauw
**A statistical framework for post-silicon tuning through body bias clustering.**[Citation Graph (0, 0)][DBLP] ICCAD, 2006, pp:39-46 [Conf] - Kaviraj Chopra, Bo Zhai, David Blaauw, Dennis Sylvester
**A new statistical max operation for propagating skewness in statistical timing analysis.**[Citation Graph (0, 0)][DBLP] ICCAD, 2006, pp:237-243 [Conf] - Shidhartha Das, Kanak Agarwal, David Blaauw, Dennis Sylvester
**Optimal Inductance for On-chip RLC Interconnections.**[Citation Graph (0, 0)][DBLP] ICCD, 2003, pp:264-0 [Conf] - Saumil Shah, Kanak Agarwal, Dennis Sylvester
**A New Threshold Voltage Assignment Scheme for Runtime Leakage Reduction in On-Chip Repeaters.**[Citation Graph (0, 0)][DBLP] ICCD, 2004, pp:138-143 [Conf] - Anup Kumar Sultania, Dennis Sylvester, Sachin S. Sapatnekar
**Transistor and Pin Reordering for Gate Oxide Leakage Reduction in Dual T{ox} Circuits.**[Citation Graph (0, 0)][DBLP] ICCD, 2004, pp:228-233 [Conf] - Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Himanshu Kaul, Richard B. Brown, Sani R. Nassif
**Power-aware global signaling strategies.**[Citation Graph (0, 0)][DBLP] ISCAS (1), 2005, pp:604-607 [Conf] - Himanshu Kaul, Dennis Sylvester, Mark Anders, Ram Krishnamurthy
**Spatial encoding circuit techniques for peak power reduction of on-chip high-performance buses.**[Citation Graph (0, 0)][DBLP] ISLPED, 2004, pp:194-199 [Conf] - Sarvesh H. Kulkarni, Ashish Srivastava, Dennis Sylvester
**A new algorithm for improved VDD assignment in low power dual VDD systems.**[Citation Graph (0, 0)][DBLP] ISLPED, 2004, pp:200-205 [Conf] - Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Richard B. Brown, Kevin J. Nowka, Sani R. Nassif
**Approaches to run-time and standby mode leakage reduction in global buses.**[Citation Graph (0, 0)][DBLP] ISLPED, 2004, pp:188-193 [Conf] - Rajeev R. Rao, Ashish Srivastava, David Blaauw, Dennis Sylvester
**Statistical estimation of leakage current considering inter- and intra-die process variation.**[Citation Graph (0, 0)][DBLP] ISLPED, 2003, pp:84-89 [Conf] - Ashish Srivastava, Robert Bai, David Blaauw, Dennis Sylvester
**Modeling and analysis of leakage power considering within-die process variations.**[Citation Graph (0, 0)][DBLP] ISLPED, 2002, pp:64-67 [Conf] - Bo Zhai, Scott Hanson, David Blaauw, Dennis Sylvester
**Analysis and mitigation of variability in subthreshold design.**[Citation Graph (0, 0)][DBLP] ISLPED, 2005, pp:20-25 [Conf] - Scott Hanson, Dennis Sylvester, David Blaauw
**A new technique for jointly optimizing gate sizing and supply voltage in ultra-low energy circuits.**[Citation Graph (0, 0)][DBLP] ISLPED, 2006, pp:338-341 [Conf] - Harmander Deogun, Robert M. Senger, Dennis Sylvester, Richard B. Brown, Kevin J. Nowka
**A dual-V**[Citation Graph (0, 0)][DBLP]_{DD}boosted pulsed bus technique for low power and low leakage operation. ISLPED, 2006, pp:73-78 [Conf] - Scott Hanson, Bo Zhai, David Blaauw, Dennis Sylvester, Andres Bryant, Xinlin Wang
**Energy optimality and variability in subthreshold design.**[Citation Graph (0, 0)][DBLP] ISLPED, 2006, pp:363-365 [Conf] - Desmond Kirkpatrick, Pete Osler, Louis Scheffer, Prashant Saxena, Dennis Sylvester
**The great interconnect buffering debate: are you a chicken or an ostrich?**[Citation Graph (0, 0)][DBLP] ISPD, 2004, pp:61- [Conf] - Rajeev R. Rao, David Blaauw, Dennis Sylvester, Charles J. Alpert, Sani R. Nassif
**An efficient surface-based low-power buffer insertion algorithm.**[Citation Graph (0, 0)][DBLP] ISPD, 2005, pp:86-93 [Conf] - Dennis Sylvester, Kurt Keutzer
**Getting to the bottom of deep submicron II: a global wiring paradigm.**[Citation Graph (0, 0)][DBLP] ISPD, 1999, pp:193-200 [Conf] - Kanak Agarwal, Kevin J. Nowka, Harmander Deogun, Dennis Sylvester
**Power Gating with Multiple Sleep Modes.**[Citation Graph (0, 0)][DBLP] ISQED, 2006, pp:633-637 [Conf] - Harmander Deogun, Rahul M. Rao, Dennis Sylvester, Richard B. Brown, Kevin J. Nowka
**Dynamically Pulsed MTCMOS with Bus Encoding for Total Power and Crosstalk Minimization.**[Citation Graph (0, 0)][DBLP] ISQED, 2005, pp:88-93 [Conf] - Harmander Deogun, Dennis Sylvester, David Blaauw
**Gate-Level Mitigation Techniques for Neutron-Induced Soft Error Rate.**[Citation Graph (0, 0)][DBLP] ISQED, 2005, pp:175-180 [Conf] - Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, Jie Yang
**Performance Driven OPC for Mask Cost Reduction.**[Citation Graph (0, 0)][DBLP] ISQED, 2005, pp:270-275 [Conf] - Vivek Joshi, Rajeev R. Rao, David Blaauw, Dennis Sylvester
**Logic SER Reduction through Flipflop Redesign.**[Citation Graph (0, 0)][DBLP] ISQED, 2006, pp:611-616 [Conf] - Dongwoo Lee, Wesley Kwong, David Blaauw, Dennis Sylvester
**Simultaneous Subthreshold and Gate-Oxide Tunneling Leakage Current Analysis in Nanometer CMOS Design.**[Citation Graph (0, 0)][DBLP] ISQED, 2003, pp:287-292 [Conf] - Himanshu Kaul, Dennis Sylvester
**Transition Aware Global Signaling (TAGS).**[Citation Graph (0, 0)][DBLP] ISQED, 2002, pp:53-0 [Conf] - Rahul M. Rao, Kanak Agarwal, Anirudh Devgan, Kevin J. Nowka, Dennis Sylvester, Richard B. Brown
**Parametric Yield Analysis and Constrained-Based Supply Voltage Optimization.**[Citation Graph (0, 0)][DBLP] ISQED, 2005, pp:284-290 [Conf] - Jae-sun Seo, Prashant Singh, Dennis Sylvester, David Blaauw
**Self-Time Regenerators for High-Speed and Low-Power Interconnect.**[Citation Graph (0, 0)][DBLP] ISQED, 2007, pp:621-626 [Conf] - Robert Bai, Sarvesh H. Kulkarni, Wesley Kwong, Ashish Srivastava, Dennis Sylvester, David Blaauw
**An Implementation of a 32-bit ARM Processor Using Dual Power Supplies and Dual Threshold Voltages.**[Citation Graph (0, 0)][DBLP] ISVLSI, 2003, pp:149-154 [Conf] - Dennis Sylvester
**Measurement techniques and interconnect estimation.**[Citation Graph (0, 0)][DBLP] SLIP, 2000, pp:79-81 [Conf] - Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Dennis Sylvester
**Investigation of performance metrics for interconnect stack architectures.**[Citation Graph (0, 0)][DBLP] SLIP, 2004, pp:23-29 [Conf] - Kanak Agarwal, Dennis Sylvester, David Blaauw
**A library compatible driving point model for on-chip RLC interconnects.**[Citation Graph (0, 0)][DBLP] Timing Issues in the Specification and Synthesis of Digital Systems, 2002, pp:63-69 [Conf] - Himanshu Kaul, Dennis Sylvester, David Blaauw
**Active shielding of RLC global interconnects.**[Citation Graph (0, 0)][DBLP] Timing Issues in the Specification and Synthesis of Digital Systems, 2002, pp:98-104 [Conf] - Kanak Agarwal, Yu Cao, Takashi Sato, Dennis Sylvester, Chenming Hu
**Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis.**[Citation Graph (0, 0)][DBLP] VLSI Design, 2002, pp:77-0 [Conf] - Yu-Shiang Lin, Dennis Sylvester
**A New Asymmetric Skewed Buffer Design for Runtime Leakage Power Reduction.**[Citation Graph (0, 0)][DBLP] VLSI Design, 2005, pp:824-827 [Conf] - Dennis Sylvester, Kurt Keutzer
**Rethinking Deep-Submicron Circuit Design.**[Citation Graph (0, 0)][DBLP] IEEE Computer, 1999, v:32, n:11, pp:25-33 [Journal] - Rajeev R. Rao, David Blaauw, Dennis Sylvester, Anirudh Devgan
**Modeling and Analysis of Parametric Yield under Power and Performance Constraints.**[Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2005, v:22, n:4, pp:376-385 [Journal] - Dennis Sylvester, Himanshu Kaul
**Power-Driven Challenges in Nanometer Design.**[Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:12-22 [Journal] - Kanak Agarwal, Mridul Agarwal, Dennis Sylvester, David Blaauw
**Statistical interconnect metrics for physical-design optimization.**[Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:7, pp:1273-1288 [Journal] - Kanak Agarwal, Dennis Sylvester, David Blaauw
**A library compatible driver output model for on-chip RLC transmission lines.**[Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:1, pp:128-136 [Journal] - Kanak Agarwal, Dennis Sylvester, David Blaauw
**A simple metric for slew rate of RC circuits based on two circuit moments.**[Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:9, pp:1346-1354 [Journal] - Kanak Agarwal, Dennis Sylvester, David Blaauw
**Modeling and analysis of crosstalk noise in coupled RLC interconnects.**[Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:5, pp:892-901 [Journal] - Puneet Gupta, Andrew B. Kahng, Puneet Sharma, Dennis Sylvester
**Gate-length biasing for runtime-leakage control.**[Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:8, pp:1475-1485 [Journal] - Dongwoo Lee, David Blaauw, Dennis Sylvester
**Static leakage reduction through simultaneous V/sub t//T/sub ox/ and state assignment.**[Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:7, pp:1014-1029 [Journal] - Rajeev R. Rao, Anirudh Devgan, David Blaauw, Dennis Sylvester
**Analytical yield prediction considering leakage/performance correlation.**[Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:9, pp:1685-1695 [Journal] - Takashi Sato, Yu Cao, Kanak Agarwal, Dennis Sylvester, Chenming Hu
**Bidirectional closed-form transformation between on-chip coupling noise waveforms and interconnect delay-change curves.**[Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:5, pp:560-572 [Journal] - Ashish Srivastava, Dennis Sylvester
**Minimizing total power by simultaneous V/sub dd//V/sub th/ assignment.**[Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:5, pp:665-677 [Journal] - Dennis Sylvester, Kurt Keutzer
**A global wiring paradigm for deep submicron design.**[Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2000, v:19, n:2, pp:242-252 [Journal] - Yu Cao, Xuejue Huang, Dennis Sylvester, Tsu-Jae King, Chenming Hu
**Impact of on-chip interconnect frequency-dependent R(f)L(f) on digital and RF design.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2005, v:13, n:1, pp:158-162 [Journal] - Yu Cao, Xiao-Dong Yang, Xuejue Huang, Dennis Sylvester
**Switch-factor based loop RLC modeling for efficient timing analysis.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2005, v:13, n:9, pp:1072-1078 [Journal] - Himanshu Kaul, Dennis Sylvester
**Low-power on-chip communication based on transition-aware global signaling (TAGS).**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2004, v:12, n:5, pp:464-476 [Journal] - Himanshu Kaul, Dennis Sylvester, Mark Anders, Ram Krishnamurthy
**Design and analysis of spatial encoding circuits for peak power reduction in on-chip buses.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2005, v:13, n:11, pp:1225-1238 [Journal] - Sarvesh H. Kulkarni, Dennis Sylvester
**High performance level conversion for dual V**[Citation Graph (0, 0)][DBLP]_{DD}design. IEEE Trans. VLSI Syst., 2004, v:12, n:9, pp:926-936 [Journal] - Dongwoo Lee, David Blaauw, Dennis Sylvester
**Gate oxide leakage current analysis and reduction for VLSI circuits.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2004, v:12, n:2, pp:155-166 [Journal] - Rajeev R. Rao, Harmander Deogun, David Blaauw, Dennis Sylvester
**Bus encoding for total power reduction using a leakage-aware buffer configuration.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2005, v:13, n:12, pp:1376-1383 [Journal] - Rajeev R. Rao, Ashish Srivastava, David Blaauw, Dennis Sylvester
**Statistical analysis of subthreshold leakage current for VLSI circuits.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2004, v:12, n:2, pp:131-139 [Journal] - Anup Kumar Sultania, Dennis Sylvester, Sachin S. Sapatnekar
**Gate oxide leakage and delay tradeoffs for dual-T/sub ox/ circuits.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2005, v:13, n:12, pp:1362-1375 [Journal] - Bo Zhai, David T. Blaauw, Dennis Sylvester, Krisztián Flautner
**The limit of dynamic voltage scaling and insomniac dynamic voltage scaling.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2005, v:13, n:11, pp:1239-1252 [Journal] - Dongwoo Lee, David Blaauw, Dennis Sylvester
**Runtime Leakage Minimization Through Probability-Aware Optimization.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2006, v:14, n:10, pp:1075-1088 [Journal] - Scott Hanson, Mingoo Seok, Dennis Sylvester, David Blaauw
**Nanometer Device Scaling in Subthreshold Circuits.**[Citation Graph (0, 0)][DBLP] DAC, 2007, pp:700-705 [Conf] - Mingoo Seok, Scott Hanson, Dennis Sylvester, David Blaauw
**Analysis and Optimization of Sleep Modes in Subthreshold Circuit Design.**[Citation Graph (0, 0)][DBLP] DAC, 2007, pp:694-699 [Conf] - Ravikishore Gandikota, Kaviraj Chopra, David Blaauw, Dennis Sylvester, Murat R. Becer
**Top-k Aggressors Sets in Delay Noise Analysis.**[Citation Graph (0, 0)][DBLP] DAC, 2007, pp:174-179 [Conf] - Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Saumil Shah, Dennis Sylvester
**Line-End Shortening is Not Always a Failure.**[Citation Graph (0, 0)][DBLP] DAC, 2007, pp:270-271 [Conf] - Harmander Deogun, Dennis Sylvester, Kevin J. Nowka
**Fine grained multi-threshold CMOS for enhanced leakage reduction.**[Citation Graph (0, 0)][DBLP] ISCAS, 2006, pp:- [Conf] - Himanshu Kaul, Dennis Sylvester, David Blaauw, Trevor N. Mudge, Todd M. Austin
**DVS for On-Chip Bus Designs Based on Timing Error Correction**[Citation Graph (0, 0)][DBLP] CoRR, 2007, v:0, n:, pp:- [Journal] - Robert Bai, Nam Sung Kim, Taeho Kgil, Dennis Sylvester, Trevor N. Mudge
**Power-Performance Trade-Offs in Nanometer-Scale Multi-Level Caches Considering Total Leakage**[Citation Graph (0, 0)][DBLP] CoRR, 2007, v:0, n:, pp:- [Journal] - H. Singh, Kanak Agarwal, Dennis Sylvester, Kevin J. Nowka
**Enhanced Leakage Reduction Techniques Using Intermediate Strength Power Gating.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2007, v:15, n:11, pp:1215-1224 [Journal] - Kanak Agarwal, Rahul M. Rao, Dennis Sylvester, Richard B. Brown
**Parametric Yield Analysis and Optimization in Leakage Dominated Technologies.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2007, v:15, n:6, pp:613-623 [Journal] - Yu Cao, Xuejue Huang, N. H. Chang, Shen Lin, O. Sam Nakagawa, Weize Xie, Dennis Sylvester, Chenming Hu
**Effective on-chip inductance modeling for multiple signal lines and application to repeater insertion.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2002, v:10, n:6, pp:799-805 [Journal] - Yu Cao, Chenming Hu, Xuejue Huang, Andrew B. Kahng, Igor L. Markov, Michael Oliver, Dirk Stroobandt, Dennis Sylvester
**Improved a priori interconnect predictions and technology extrapolation in the GTX system.**[Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2003, v:11, n:1, pp:3-14 [Journal] - Sarvesh H. Kulkarni, Dennis Sylvester
**Power Distribution Techniques for Dual VDD Circuits.**[Citation Graph (0, 0)][DBLP] J. Low Power Electronics, 2006, v:2, n:2, pp:217-229 [Journal] **An Energy Efficient Parallel Architecture Using Near Threshold Operation.**[Citation Graph (, )][DBLP]**Runtime leakage power estimation technique for combinational circuits.**[Citation Graph (, )][DBLP]**Simple and Accurate Models for Capacitance Increment due to Metal Fill Insertion.**[Citation Graph (, )][DBLP]**Investigation of diffusion rounding for post-lithography analysis.**[Citation Graph (, )][DBLP]**Clock tree synthesis with data-path sensitivity matching.**[Citation Graph (, )][DBLP]**Modeling crosstalk in statistical static timing analysis.**[Citation Graph (, )][DBLP]**Leakage power reduction using stress-enhanced layouts.**[Citation Graph (, )][DBLP]**Efficient Monte Carlo based incremental statistical timing analysis.**[Citation Graph (, )][DBLP]**Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence.**[Citation Graph (, )][DBLP]**Vicis: a reliable network for unreliable silicon.**[Citation Graph (, )][DBLP]**Closed-form modeling of layout-dependent mechanical stress.**[Citation Graph (, )][DBLP]**Efficient smart monte carlo based SSTA on graphics processing units with improved resource utilization.**[Citation Graph (, )][DBLP]**A highly resilient routing algorithm for fault-tolerant NoCs.**[Citation Graph (, )][DBLP]**A black box method for stability analysis of arbitrary SRAM cell structures.**[Citation Graph (, )][DBLP]**Process variation and temperature-aware reliability management.**[Citation Graph (, )][DBLP]**Yield-driven near-threshold SRAM design.**[Citation Graph (, )][DBLP]**Victim alignment in crosstalk aware timing analysis.**[Citation Graph (, )][DBLP]**On the decreasing significance of large standard cells in technology mapping.**[Citation Graph (, )][DBLP]**Soft-edge flip-flops for improved timing yield: design and optimization.**[Citation Graph (, )][DBLP]**A statistical approach for full-chip gate-oxide reliability analysis.**[Citation Graph (, )][DBLP]**STEEL: a technique for stress-enhanced standard cell library design.**[Citation Graph (, )][DBLP]**Post-fabrication measurement-driven oxide breakdown reliability prediction and management.**[Citation Graph (, )][DBLP]**Timing error correction techniques for voltage-scalable on-chip memories.**[Citation Graph (, )][DBLP]**A robust alternate repeater technique for high performance busses in the multi-core era.**[Citation Graph (, )][DBLP]**Low-voltage circuit design for widespread sensing applications.**[Citation Graph (, )][DBLP]**A robust edge encoding technique for energy-efficient multi-cycle interconnect.**[Citation Graph (, )][DBLP]**Optimal technology selection for minimizing energy and variability in low voltage applications.**[Citation Graph (, )][DBLP]**Energy efficient near-threshold chip multi-processing.**[Citation Graph (, )][DBLP]**Variation-aware gate sizing and clustering for post-silicon optimized circuits.**[Citation Graph (, )][DBLP]**Clock network design for ultra-low power applications.**[Citation Graph (, )][DBLP]**Low power circuit design based on heterojunction tunneling transistors (HETTs).**[Citation Graph (, )][DBLP]**Stress aware layout optimization.**[Citation Graph (, )][DBLP]**Fast and Accurate Waveform Analysis with Current Source Models.**[Citation Graph (, )][DBLP]**Analysis of System-Level Reliability Factors and Implications on Real-Time Monitoring Methods for Oxide Breakdown Device Failures.**[Citation Graph (, )][DBLP]**Simultaneous extraction of effective gate length and low-field mobility in non-uniform devices.**[Citation Graph (, )][DBLP]**Reconfigurable energy efficient near threshold cache architectures.**[Citation Graph (, )][DBLP]**Reconfigurable Multicore Server Processors for Low Power Operation.**[Citation Graph (, )][DBLP]**ElastIC: An Adaptive Self-Healing Architecture for Unpredictable Silicon.**[Citation Graph (, )][DBLP]**Sensor-Driven Reliability and Wearout Management.**[Citation Graph (, )][DBLP]
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