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Publications of Author

1. Takashi Aikyo
   Issues on SOC testing in DSM area: embedded tutorial. [Citation Graph (0, 0)][DBLP]
   ASP-DAC, 2000, pp:515-516 [Conf]
   
2. Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi
   ATREX : Design for Testability System for Mega Gate LSIs. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1997, pp:126-0 [Conf]
   
3. Takashi Aikyo, Y. Hatano, J. Ishii, N. Karasawa, S. Fujii
   An Automatic Test Generation System for Large Scale Gate Arrays. [Citation Graph (0, 0)][DBLP]
   COMPCON, 1986, pp:445-451 [Conf]
   
4. Douglas Chang, Mike Tien-Chien Lee, Malgorzata Marek-Sadowska, Takashi Aikyo, Kwang-Ting Cheng
   A Test Synthesis Approach to Reducing BALLAST DFT Overhead. [Citation Graph (0, 0)][DBLP]
   DAC, 1997, pp:466-471 [Conf]
   
5. Hiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato
   Effective Post-BIST Fault Diagnosis for Multiple Faults. [Citation Graph (0, 0)][DBLP]
   DFT, 2006, pp:401-109 [Conf]
   
6. 
   An Adaptive Test for Parametric Faults Based on Statistical Timing Information. [Citation Graph (, )][DBLP]
   
   
7. 
   Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. [Citation Graph (, )][DBLP]
   
   
8. 
   Timing-Aware Diagnosis for Small Delay Defects. [Citation Graph (, )][DBLP]
   
   
9. 
   Estimation of delay test quality and its application to test generation. [Citation Graph (, )][DBLP]
   
   
10. 
    Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. [Citation Graph (, )][DBLP]
    
    
11. 
    A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. [Citation Graph (, )][DBLP]
    
    
12. 
    A Novel Approach for Improving the Quality of Open Fault Diagnosis. [Citation Graph (, )][DBLP]
    
    
13. 
    Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. [Citation Graph (, )][DBLP]