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Takashi Aikyo: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Takashi Aikyo
    Issues on SOC testing in DSM area: embedded tutorial. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2000, pp:515-516 [Conf]
  2. Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi
    ATREX : Design for Testability System for Mega Gate LSIs. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1997, pp:126-0 [Conf]
  3. Takashi Aikyo, Y. Hatano, J. Ishii, N. Karasawa, S. Fujii
    An Automatic Test Generation System for Large Scale Gate Arrays. [Citation Graph (0, 0)][DBLP]
    COMPCON, 1986, pp:445-451 [Conf]
  4. Douglas Chang, Mike Tien-Chien Lee, Malgorzata Marek-Sadowska, Takashi Aikyo, Kwang-Ting Cheng
    A Test Synthesis Approach to Reducing BALLAST DFT Overhead. [Citation Graph (0, 0)][DBLP]
    DAC, 1997, pp:466-471 [Conf]
  5. Hiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato
    Effective Post-BIST Fault Diagnosis for Multiple Faults. [Citation Graph (0, 0)][DBLP]
    DFT, 2006, pp:401-109 [Conf]

  6. An Adaptive Test for Parametric Faults Based on Statistical Timing Information. [Citation Graph (, )][DBLP]


  7. Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. [Citation Graph (, )][DBLP]


  8. Timing-Aware Diagnosis for Small Delay Defects. [Citation Graph (, )][DBLP]


  9. Estimation of delay test quality and its application to test generation. [Citation Graph (, )][DBLP]


  10. Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. [Citation Graph (, )][DBLP]


  11. A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. [Citation Graph (, )][DBLP]


  12. A Novel Approach for Improving the Quality of Open Fault Diagnosis. [Citation Graph (, )][DBLP]


  13. Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. [Citation Graph (, )][DBLP]


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