Tao Li, Ximeng Guan, Zhiping Yu, Wei Xue Computation of Si Nanowire Bandstructures on Parallel Machines Through Domain Decomposition. [Citation Graph (0, 0)][DBLP] International Conference on Computational Science (1), 2006, pp:250-257 [Conf]
Yutao Ma, Litian Liu, Lilin Tian, Zhiping Yu, Zhijian Li Analytical charge-control and I-V model for submicrometer anddeep-submicrometer MOSFETs fully comprising quantum mechanical effects. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2001, v:20, n:4, pp:495-502 [Journal]
Chiaki Takano, Zhiping Yu, Robert W. Dutton A nonequilibrium one-dimensional quantum-mechanical simulation for AlGaAs/GaAs HEMT structures. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1990, v:9, n:11, pp:1217-1224 [Journal]
Zhiping Yu, Robert W. Dutton, Massimo Vanzi An Extension to Newton's Method in Device Simulators--On An Efficient Algorithm to Evaluate Small-Signal Parameters and to Predict Initial Guess. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1987, v:6, n:1, pp:41-45 [Journal]
Tao Li, Zhiping Yu Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage. [Citation Graph (0, 0)][DBLP] DAC, 2007, pp:99-102 [Conf]
Massively Parallel Finite Element Simulator for Full-Chip STI Stress Analysis. [Citation Graph (, )][DBLP]
Efficient techniques for 3-D impedance extraction using mixed boundary element method. [Citation Graph (, )][DBLP]
Full-chip leakage analysis in nano-scale technologies: mechanisms, variation sources, and verification. [Citation Graph (, )][DBLP]
Efficient tail estimation for massive correlated log-normal sums: with applications in statistical leakage analysis. [Citation Graph (, )][DBLP]
An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation. [Citation Graph (, )][DBLP]
A highly efficient optimization algorithm for pixel manipulation in inverse lithography technique. [Citation Graph (, )][DBLP]
An efficient algorithm for modeling spatially-correlated process variation in statistical full-chip leakage analysis. [Citation Graph (, )][DBLP]
Layout-dependent STI stress analysis and stress-aware RF/analog circuit design optimization. [Citation Graph (, )][DBLP]
A Statistical Characterization of CMOS Process Fluctuations in Subthreshold Current Mirrors. [Citation Graph (, )][DBLP]
Full-Chip Leakage Verification for Manufacturing Considering Process Variations. [Citation Graph (, )][DBLP]
A comprehensive model for gate delay under process variation and different driving and loading conditions. [Citation Graph (, )][DBLP]
High performance source optimization using a gradient-based method in optical lithography. [Citation Graph (, )][DBLP]
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