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Fook-Luen Heng :
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C. K. Cheng , Steve Lin , Andrew B. Kahng , Keh-Jeng Chang , Vijay Pitchumani , Toshiyuki Shibuya , Roberto Suaya , Zhiping Yu , Fook-Luen Heng , Don MacMillen Panel I: who is responsible for the design for manufacturability issues in the era of nano-technologies? [Citation Graph (0, 0)][DBLP ] ASP-DAC, 2005, pp:- [Conf ] Puneet Gupta , Fook-Luen Heng Toward a systematic-variation aware timing methodology. [Citation Graph (0, 0)][DBLP ] DAC, 2004, pp:321-326 [Conf ] Lars Liebmann , Jennifer Lund , Fook-Luen Heng , Ioana Graur Enabling Alternating Phase Shifted Mask Designs for a Full Logic Gate Level: Design Rules and Design Rule Checking. [Citation Graph (0, 0)][DBLP ] DAC, 2001, pp:79-84 [Conf ] Zhan Chen , Fook-Luen Heng A Fast Minimum Layout Perturbation Algorithm for Electromigration Reliability Enhancement. [Citation Graph (0, 0)][DBLP ] DFT, 1998, pp:56-63 [Conf ] Alexey Lvov , Fook-Luen Heng A graph based simplex method for the integer minimum perturbation problem with sum and difference constraints. [Citation Graph (0, 0)][DBLP ] ACM Great Lakes Symposium on VLSI, 2004, pp:67-72 [Conf ] Mark A. Lavin , Fook-Luen Heng , Gregory A. Northrop Backend CAD flows for "restrictive design rules". [Citation Graph (0, 0)][DBLP ] ICCAD, 2004, pp:739-746 [Conf ] Fook-Luen Heng , Zhan Chen , Gustavo E. Téllez A VLSI artwork legalization technique based on a new criterion of minimum layout perturbation. [Citation Graph (0, 0)][DBLP ] ISPD, 1997, pp:116-121 [Conf ] Fook-Luen Heng , Lars Liebmann , Jennifer Lund Application of automated design migration to alternating phase shift mask design. [Citation Graph (0, 0)][DBLP ] ISPD, 2001, pp:38-43 [Conf ] Xin Yuan , Kevin W. McCullen , Fook-Luen Heng , Robert F. Walker , Jason Hibbeler , Robert J. Allen , Rani R. Narayan Technology migration technique for designs with strong RET-driven layout restrictions. [Citation Graph (0, 0)][DBLP ] ISPD, 2005, pp:175-182 [Conf ] Yield estimation of SRAM circuits using "Virtual SRAM Fab". [Citation Graph (, )][DBLP ] Pre-Si estimation and compensation of SRAM layout deficiencies to achieve target performance and yield. [Citation Graph (, )][DBLP ] Search in 0.001secs, Finished in 0.002secs