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Fook-Luen Heng: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. C. K. Cheng, Steve Lin, Andrew B. Kahng, Keh-Jeng Chang, Vijay Pitchumani, Toshiyuki Shibuya, Roberto Suaya, Zhiping Yu, Fook-Luen Heng, Don MacMillen
    Panel I: who is responsible for the design for manufacturability issues in the era of nano-technologies? [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2005, pp:- [Conf]
  2. Puneet Gupta, Fook-Luen Heng
    Toward a systematic-variation aware timing methodology. [Citation Graph (0, 0)][DBLP]
    DAC, 2004, pp:321-326 [Conf]
  3. Lars Liebmann, Jennifer Lund, Fook-Luen Heng, Ioana Graur
    Enabling Alternating Phase Shifted Mask Designs for a Full Logic Gate Level: Design Rules and Design Rule Checking. [Citation Graph (0, 0)][DBLP]
    DAC, 2001, pp:79-84 [Conf]
  4. Zhan Chen, Fook-Luen Heng
    A Fast Minimum Layout Perturbation Algorithm for Electromigration Reliability Enhancement. [Citation Graph (0, 0)][DBLP]
    DFT, 1998, pp:56-63 [Conf]
  5. Alexey Lvov, Fook-Luen Heng
    A graph based simplex method for the integer minimum perturbation problem with sum and difference constraints. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2004, pp:67-72 [Conf]
  6. Mark A. Lavin, Fook-Luen Heng, Gregory A. Northrop
    Backend CAD flows for "restrictive design rules". [Citation Graph (0, 0)][DBLP]
    ICCAD, 2004, pp:739-746 [Conf]
  7. Fook-Luen Heng, Zhan Chen, Gustavo E. Téllez
    A VLSI artwork legalization technique based on a new criterion of minimum layout perturbation. [Citation Graph (0, 0)][DBLP]
    ISPD, 1997, pp:116-121 [Conf]
  8. Fook-Luen Heng, Lars Liebmann, Jennifer Lund
    Application of automated design migration to alternating phase shift mask design. [Citation Graph (0, 0)][DBLP]
    ISPD, 2001, pp:38-43 [Conf]
  9. Xin Yuan, Kevin W. McCullen, Fook-Luen Heng, Robert F. Walker, Jason Hibbeler, Robert J. Allen, Rani R. Narayan
    Technology migration technique for designs with strong RET-driven layout restrictions. [Citation Graph (0, 0)][DBLP]
    ISPD, 2005, pp:175-182 [Conf]

  10. Yield estimation of SRAM circuits using "Virtual SRAM Fab". [Citation Graph (, )][DBLP]


  11. Pre-Si estimation and compensation of SRAM layout deficiencies to achieve target performance and yield. [Citation Graph (, )][DBLP]


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