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Hongjoong Shin: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Minsik Cho, Hongjoong Shin, David Z. Pan
    Fast substrate noise-aware floorplanning with preference directed graph for mixed-signal SOCs. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2006, pp:765-770 [Conf]
  2. Hongjoong Shin, Hak-soo Yu, Jacob A. Abraham
    LFSR-based BIST for analog circuits using slope detection. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2004, pp:316-321 [Conf]
  3. Joonsung Park, Hongjoong Shin, Jacob A. Abraham
    Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model. [Citation Graph (0, 0)][DBLP]
    ISQED, 2007, pp:495-500 [Conf]
  4. Hak-soo Yu, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
    Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:1389-1397 [Conf]
  5. Ashwin Raghunathan, Hongjoong Shin, Jacob A. Abraham, Abhijit Chatterjee
    Prediction of Analog Performance Parameters Using Oscillation Based Test. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:377-382 [Conf]
  6. Hongjoong Shin, Byoungho Kim, Jacob A. Abraham
    Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:412-419 [Conf]
  7. Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
    Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2006, pp:199-204 [Conf]

  8. Parallel Loopback Test of Mixed-Signal Circuits. [Citation Graph (, )][DBLP]


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