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Ahmad E. Islam: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Mohammad Ashraful Alam, Kaushik Roy
    Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement. [Citation Graph (0, 0)][DBLP]
    DAC, 2007, pp:358-363 [Conf]

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