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Publications of Author

1. Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez
   Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. [Citation Graph (0, 0)][DBLP]
   DATE, 2007, pp:1301-1306 [Conf]
   
2. Amir Zjajo, José Pineda de Gyvez, Guido Gronthoud
   Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2006, v:22, n:4-6, pp:399-409 [Journal]
   
3. 
   RDE-based transistor-level gate simulation for statistical static timing analysis. [Citation Graph (, )][DBLP]
   
   
4. 
   Diagnostic Analysis of Static Errors in Multi-Step Analog to Digital Converters. [Citation Graph (, )][DBLP]
   
   
5. 
   Efficient Estimation of Die-Level Process Parameter Variations via the EM-Algorithm. [Citation Graph (, )][DBLP]
   
   
6. 
   Calibration and Debugging of Multi-step Analog to Digital Converters. [Citation Graph (, )][DBLP]
   
   
7. 
   A low-power digitally-programmable variable gain amplifier in 65 nm CMOS. [Citation Graph (, )][DBLP]
   
   
8. 
   Algorithms for ADC Multi-site Test with Digital Input Stimulus. [Citation Graph (, )][DBLP]