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Amir Zjajo: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez
    Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:1301-1306 [Conf]
  2. Amir Zjajo, José Pineda de Gyvez, Guido Gronthoud
    Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:4-6, pp:399-409 [Journal]

  3. RDE-based transistor-level gate simulation for statistical static timing analysis. [Citation Graph (, )][DBLP]

  4. Diagnostic Analysis of Static Errors in Multi-Step Analog to Digital Converters. [Citation Graph (, )][DBLP]

  5. Efficient Estimation of Die-Level Process Parameter Variations via the EM-Algorithm. [Citation Graph (, )][DBLP]

  6. Calibration and Debugging of Multi-step Analog to Digital Converters. [Citation Graph (, )][DBLP]

  7. A low-power digitally-programmable variable gain amplifier in 65 nm CMOS. [Citation Graph (, )][DBLP]

  8. Algorithms for ADC Multi-site Test with Digital Input Stimulus. [Citation Graph (, )][DBLP]

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