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Aart J. de Geus :
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Aart J. de Geus Electronic Industry on Fire: How to Survive and Thrive. [Citation Graph (0, 0)][DBLP ] ASP-DAC, 2002, pp:6- [Conf ] Joseph B. Costello , Walden C. Rhines , Aart J. de Geus , Alain Hanover , Doug Fairbairn , Rick Carlson , Ronald Collett Executive Perspective and Vision of the Future of EDA (Panel). [Citation Graph (0, 0)][DBLP ] DAC, 1994, pp:48- [Conf ] Robert Dahlberg , Kurt Keutzer , R. Bingham , Aart J. de Geus , Walden C. Rhines EDA: this is serious business. [Citation Graph (0, 0)][DBLP ] DAC, 2004, pp:1- [Conf ] David Gregory , Karen A. Bartlett , Aart J. de Geus , Gary D. Hachtel SOCRATES: a system for automatically synthesizing and optimizing combinational logic. [Citation Graph (0, 0)][DBLP ] DAC, 1986, pp:79-85 [Conf ] Aart J. de Geus Logic synthesis and optimization benchmarks for the 1986 Design Automation Conference. [Citation Graph (0, 0)][DBLP ] DAC, 1986, pp:78- [Conf ] Jay Vleeschhouwer , Warren East , Michael J. Fister , Aart J. de Geus , Walden C. Rhines , Jackson Hu , Rick Cassidy Differentiate and deliver: leveraging your partners. [Citation Graph (0, 0)][DBLP ] DAC, 2005, pp:1- [Conf ] Aart J. de Geus High Level Design: A Design Vision for the 90's. [Citation Graph (0, 0)][DBLP ] ICCD, 1992, pp:8- [Conf ] Aart J. de Geus Slap it Together and Ship it! [Citation Graph (0, 0)][DBLP ] ISQED, 2000, pp:23-24 [Conf ] Aart J. de Geus Test: The New Value-Added Field. [Citation Graph (0, 0)][DBLP ] ITC, 1994, pp:12- [Conf ] Aart J. de Geus Electronic Industry on Fire: How to Survive and Thrive. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2002, pp:6- [Conf ] Allen Dewey , Aart J. de Geus VHDL: Toward a Unified View of Design. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1992, v:9, n:2, pp:8-17 [Journal ] Karen A. Bartlett , William W. Cohen , Aart J. de Geus , Gary D. Hachtel Synthesis and Optimization of Multilevel Logic under Timing Constraints. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1986, v:5, n:4, pp:582-596 [Journal ] Robert Lisanke , Franc Brglez , Aart J. de Geus , David Gregory Testability-Driven Random Test-Pattern Generation. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1987, v:6, n:6, pp:1082-1087 [Journal ] Francine Bacchini , Greg Spirakis , Juan Antonio Carballo , Kurt Keutzer , Aart J. de Geus , Fu-Chieh Hsu , Kazu Yamada Megatrends and EDA 2017. [Citation Graph (0, 0)][DBLP ] DAC, 2007, pp:21-22 [Conf ] A. Richard Newton: Technologist with a Mission. [Citation Graph (, )][DBLP ] Search in 0.002secs, Finished in 0.002secs