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Indradeep Ghosh :
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Indradeep Ghosh , Krishna Sekar , Vamsi Boppana Design for Verification at the Register Transfer Level. [Citation Graph (0, 0)][DBLP ] ASP-DAC, 2002, pp:420-425 [Conf ] Indradeep Ghosh High Level Test Generation for Custom Hardware: An Industrial Perspective. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 2005, pp:458- [Conf ] Liang Zhang , Michael S. Hsiao , Indradeep Ghosh Automatic Design Validation Framework for HDL Descriptions via RTL ATPG. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 2003, pp:148-153 [Conf ] Indradeep Ghosh , Sujit Dey , Niraj K. Jha A Fast and Low Cost Testing Technique for Core-Based System-on-Chip. [Citation Graph (0, 0)][DBLP ] DAC, 1998, pp:542-547 [Conf ] Indradeep Ghosh , Masahiro Fujita Automatic test pattern generation for functional RTL circuits using assignment decision diagrams. [Citation Graph (0, 0)][DBLP ] DAC, 2000, pp:43-48 [Conf ] Indradeep Ghosh , Niraj K. Jha , Sudipta Bhawmik A BIST Scheme for RTL Controller-Data Paths Based on Symbolic Testability Analysis. [Citation Graph (0, 0)][DBLP ] DAC, 1998, pp:554-559 [Conf ] Indradeep Ghosh , Anand Raghunathan , Niraj K. Jha Hierarchical Test Generation and Design for Testability of ASPPs and ASIPs. [Citation Graph (0, 0)][DBLP ] DAC, 1997, pp:534-539 [Conf ] Indradeep Ghosh , Srivaths Ravi On automatic generation of RTL validation test benches using circuit testing techniques. [Citation Graph (0, 0)][DBLP ] ACM Great Lakes Symposium on VLSI, 2003, pp:289-294 [Conf ] Indradeep Ghosh , Anand Raghunathan , Niraj K. Jha A design for testability technique for RTL circuits using control/data flow extraction. [Citation Graph (0, 0)][DBLP ] ICCAD, 1996, pp:329-336 [Conf ] Afshin Abdollahi , Massoud Pedram , Farzan Fallah , Indradeep Ghosh Precomputation-based Guarding for Dynamic and Leakage Power Reduction. [Citation Graph (0, 0)][DBLP ] ICCD, 2003, pp:90-97 [Conf ] Indradeep Ghosh , Anand Raghunathan , Niraj K. Jha Design for hierarchical testability of RTL circuits obtained by behavioral synthesis. [Citation Graph (0, 0)][DBLP ] ICCD, 1995, pp:173-179 [Conf ] Srivaths Ravi , Niraj K. Jha , Indradeep Ghosh , Vamsi Boppana A Technique for Identifying RTL and Gate-Level Correspondences. [Citation Graph (0, 0)][DBLP ] ICCD, 2000, pp:591-0 [Conf ] Indradeep Ghosh , Mukul R. Prasad A Technique for Estimating the Difficulty of a Formal Verification Problem. [Citation Graph (0, 0)][DBLP ] ISQED, 2006, pp:63-70 [Conf ] Indradeep Ghosh , Niraj K. Jha , Sujit Dey A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems. [Citation Graph (0, 0)][DBLP ] ITC, 1997, pp:50-59 [Conf ] Liang Zhang , Indradeep Ghosh , Michael S. Hsiao Efficient Sequential ATPG for Functional RTL Circuits. [Citation Graph (0, 0)][DBLP ] ITC, 2003, pp:290-298 [Conf ] Sudipta Bhawmik , Indradeep Ghosh A Practical Method for Selecting Partial Scan Flip-flops for Large Circuits. [Citation Graph (0, 0)][DBLP ] VLSI Design, 1997, pp:284-288 [Conf ] Vamsi Boppana , Indradeep Ghosh , Rajarshi Mukherjee , Jawahar Jain , Masahiro Fujita Hierarchical Error Diagnosis Targeting RTL Circuits. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2000, pp:436-441 [Conf ] Indradeep Ghosh , Bandana Majumdar Design of an Application Specific VLSI Chip for Image Rotation. [Citation Graph (0, 0)][DBLP ] VLSI Design, 1994, pp:275-278 [Conf ] Indradeep Ghosh , Rajarshi Mukherjee , Mukul R. Prasad , Masahiro Fujita High Level Design Validation: Current Practices and Future Directions. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2004, pp:9-11 [Conf ] Indradeep Ghosh , Krishna Sekar , Vamsi Boppana Design for Verification at the Register Transfer Level. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2002, pp:420-425 [Conf ] Srivaths Ravi , Indradeep Ghosh , Rabindra K. Roy , Sujit Dey Controller Resynthesis for Testability Enhancement of RTL Controller/Data path Circuits. [Citation Graph (0, 0)][DBLP ] VLSI Design, 1998, pp:193-198 [Conf ] Indradeep Ghosh , Bandana Majumdar VLSI Implementation of An Efficient ASIC Architecture for Real-Time Rotation of Digital Images. [Citation Graph (0, 0)][DBLP ] IJPRAI, 1995, v:9, n:2, pp:449-462 [Journal ] Indradeep Ghosh , Niraj K. Jha High-level test synthesis: a survey. [Citation Graph (0, 0)][DBLP ] Integration, 1998, v:26, n:1-2, pp:79-99 [Journal ] Indradeep Ghosh , Sujit Dey , Niraj K. Jha A fast and low-cost testing technique for core-based system-chips. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2000, v:19, n:8, pp:863-877 [Journal ] Indradeep Ghosh , Masahiro Fujita Automatic test pattern generation for functional register-transferlevel circuits using assignment decision diagrams. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2001, v:20, n:3, pp:402-415 [Journal ] Indradeep Ghosh , Niraj K. Jha , Sudipta Bhawmik A BIST scheme for RTL circuits based on symbolic testabilityanalysis. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2000, v:19, n:1, pp:111-128 [Journal ] Indradeep Ghosh , Niraj K. Jha , Sujit Dey A low overhead design for testability and test generation technique for core-based systems-on-a-chip. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:11, pp:1661-1676 [Journal ] Indradeep Ghosh , Anand Raghunathan , Niraj K. Jha Design for hierarchical testability of RTL circuits obtained by behavioral synthesis. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1997, v:16, n:9, pp:1001-1014 [Journal ] Indradeep Ghosh , Anand Raghunathan , Niraj K. Jha A design-for-testability technique for register-transfer level circuits using control/data flow extraction. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1998, v:17, n:8, pp:706-723 [Journal ] Indradeep Ghosh , Anand Raghunathan , Niraj K. Jha Hierarchical test generation and design for testability methods for ASPPs and ASIPs. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:3, pp:357-370 [Journal ] Srivaths Ravi , Indradeep Ghosh , Vamsi Boppana , Niraj K. Jha Fault-diagnosis-based technique for establishing RTL and gate-levelcorrespondences. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2001, v:20, n:12, pp:1414-1425 [Journal ] Liang Zhang , Indradeep Ghosh , Michael S. Hsiao A Framework for Automatic Design Validation of RTL Circuits Using ATPG and Observability-Enhanced Tag Coverage. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:11, pp:2526-2538 [Journal ] Context-Sensitive Relevancy Analysis for Efficient Symbolic Execution. [Citation Graph (, )][DBLP ] WEAVE: WEb Applications Validation Environment. [Citation Graph (, )][DBLP ] Search in 0.002secs, Finished in 0.305secs