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Rochit Rajsuman: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Kazumi Hatayama, Rochit Rajsuman
    Opportunities with the open architecture test system. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2004, pp:334- [Conf]
  2. Rochit Rajsuman
    New opportunities with the open architecture test system. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2004, pp:335- [Conf]
  3. Rochit Rajsuman
    Extending EDA Environment From Design to Test. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2002, pp:386-391 [Conf]
  4. Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya
    CMOS Stuck-open Fault Detection Using Single Test Patterns. [Citation Graph (0, 0)][DBLP]
    DAC, 1989, pp:714-717 [Conf]
  5. Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana
    On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates. [Citation Graph (0, 0)][DBLP]
    DAC, 1987, pp:244-250 [Conf]
  6. Rochit Rajsuman
    An Overview of the Open Architecture Test System. [Citation Graph (0, 0)][DBLP]
    DELTA, 2004, pp:341-348 [Conf]
  7. Rochit Rajsuman
    Innovation In Test: Where Are We. [Citation Graph (0, 0)][DBLP]
    DELTA, 2006, pp:289-294 [Conf]
  8. Rochit Rajsuman
    Towards The Methodology of On-line Diagnosis. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2006, pp:76- [Conf]
  9. Jerry Katz, Rochit Rajsuman
    A new paradigm in test for the next millennium. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:468-476 [Conf]
  10. Roderick McConnell, Rochit Rajsuman, Eric A. Nelson, Jeffrey Dreibelbis
    Test and repair of large embedded DRAMs. I. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:163-172 [Conf]
  11. Rochit Rajsuman
    Testing The Tester. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:27- [Conf]
  12. Rochit Rajsuman
    Testing The Tester. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:30- [Conf]
  13. Rochit Rajsuman
    Can IC Test Learn from How a Tester is Tested. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1186- [Conf]
  14. Rochit Rajsuman
    Challenge of the 90's: Testing CoreWareTM Based ASICs. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:940- [Conf]
  15. Rochit Rajsuman
    Testing a system-on-a-chip with embedded microprocessor. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:499-508 [Conf]
  16. Rochit Rajsuman, Masuda Noriyuki
    Open Architecture Test System: System Architecture and Design. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:403-412 [Conf]
  17. S. Hwang, Rochit Rajsuman, Yashwant K. Malaiya
    On the testing of microprogrammed processor. [Citation Graph (0, 0)][DBLP]
    MICRO, 1990, pp:260-266 [Conf]
  18. S. Hwang, Rochit Rajsuman, Scott Davidson
    IDDQ Detection of CMOS Bridging Faults by Stuck-At Fault Tests. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1994, pp:183-186 [Conf]
  19. Rochit Rajsuman, D. A. Penry
    Coverage of Bridging Faults by Random Testing in IDDQ Test Environment. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1993, pp:136-139 [Conf]
  20. Rochit Rajsuman
    Design and Test of Large Embedded Memories: An Overview. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2001, v:18, n:3, pp:16-27 [Journal]
  21. Rochit Rajsuman, Francky Catthoor
    Guest Editors' Intoduction: The New World of Large Embedded Memories. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2001, v:18, n:3, pp:3-4 [Journal]
  22. Rochit Rajsuman
    A new testing method for EEPLA. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1994, v:13, n:7, pp:935-939 [Journal]
  23. Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana
    Limitations of switch level analysis for bridging faults. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1989, v:8, n:7, pp:807-811 [Journal]

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