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Publications of Author

1. Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase
   Test data compression technique using selective don't-care identification. [Citation Graph (0, 0)][DBLP]
   ASP-DAC, 2004, pp:230-233 [Conf]
   
2. Kai Zhang, Tsuyoshi Shinogi, Haruhiko Takase, Terumine Hayashi
   A Method for Evaluating Upper Bound of Simultaneous Switching Gates Using Circuit Partition. [Citation Graph (0, 0)][DBLP]
   ASP-DAC, 1999, pp:291-294 [Conf]
   
3. Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Terumine Hayashi
   On a Logical Fault Model H1SGLF for Enhancing Defect Coverage. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1998, pp:102-107 [Conf]
   
4. Tsuyoshi Shinogi, Terumine Hayashi
   A Parallel Generation System of Compact IDDQ Test Sets for Large Combinational Circuits. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1999, pp:164-0 [Conf]
   
5. Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki
   Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1997, pp:16-21 [Conf]
   
6. Tsuyoshi Shinogi, Tomokazu Kanbayashi, Tomohiro Yoshikawa, Shinji Tsuruoka, Terumine Hayashi
   Faulty Resistance Sectioning Technique for Resistive Bridging Fault ATPG Systems. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2001, pp:76-81 [Conf]
   
7. Tsuyoshi Shinogi, Masahiro Ushio, Terumine Hayashi
   Cyclic greedy generation method for limited number of IDDQ tests. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2000, pp:362-0 [Conf]
   
8. Tsuyoshi Shinogi, Hiroyuki Yamada, Terumine Hayashi, Shinji Tsuruoka, Tomohiro Yoshikawa
   A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2005, pp:366-371 [Conf]
   
9. Tsuyoshi Shinogi, Yuki Yamada, Terumine Hayashi, Tomohiro Yoshikawa, Shinji Tsuruoka
   Between-Core Vector Overlapping for Test Cost Reduction in Core Testing. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2003, pp:268-273 [Conf]
   
10. Kouichi Kumon, Akira Asato, Susumu Arai, Tsuyoshi Shinogi, Akira Hattori, Hiroyoshi Hatazawa, Kiyoshi Hirano
    Architecture and Implementation of PIM/p. [Citation Graph (0, 0)][DBLP]
    FGCS, 1992, pp:414-424 [Conf]
    
11. Tsuyoshi Shinogi, Kouichi Kumon, Akira Hattori, Atsuhiro Goto, Yasunori Kimura, Takashi Chikayama
    Macro-Call Instruction for the Efficient KL1 Implementation on PIM. [Citation Graph (0, 0)][DBLP]
    FGCS, 1988, pp:953-961 [Conf]
    
12. Shinji Tsuruoka, Toru Yamaguchi, Kenji Kato, Tomohiro Yoshikawa, Tsuyoshi Shinogi
    A Camera Control Based Fuzzy Behaviour Recognition of Lecturer for Distance Lecture. [Citation Graph (0, 0)][DBLP]
    FUZZ-IEEE, 2001, pp:940-943 [Conf]
    
13. Shinji Tsuruoka, Toru Tanaka, Tomohiro Yoshikawa, Tsuyoshi Shinogi, Kensuke Takao
    Region Segmentation for Table Image with Unknown Complex Structure. [Citation Graph (0, 0)][DBLP]
    ICDAR, 2001, pp:709-0 [Conf]
    
14. Teruyuki Yamaguchi, Tomohiro Yoshikawa, Tsuyoshi Shinogi, Shinji Tsuruoka, Masato Teramoto
    A Segmentation Method for Touching Japanese Handwritten Characters Based on Connecting Condition of Line. [Citation Graph (0, 0)][DBLP]
    ICDAR, 2001, pp:837-0 [Conf]
    
15. Haruhiko Takase, Tsuyoshi Shinogi, Terumine Hayashi, Hidehiko Kita
    Evaluation Function for Fault Tolerant Multi-Layer Neural Networks. [Citation Graph (0, 0)][DBLP]
    IJCNN (3), 2000, pp:521-526 [Conf]
    
16. Mitsuhiro Kishimoto, Tsuyoshi Shinogi, Yasunori Kimura, Akira Hattori
    Design and Evaluation of a Prolog Compiler. [Citation Graph (0, 0)][DBLP]
    LP, 1985, pp:192-203 [Conf]
    
17. Tsuyoshi Shinogi, Terumine Hayashi
    A Simple and Efficient Method for Generating Compact IDDQ Test Set for Bridging Fault. [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:112-117 [Conf]
    
18. Yoshifumi Banno, Tomohiro Yoshikawa, Hiroharu Kawanaka, Tsuyoshi Shinogi, Shinji Tsuruoka
    A Study on Deriving a Method for Chromosome Similarities Suitable for the Search Space. [Citation Graph (0, 0)][DBLP]
    JACIII, 2002, v:6, n:3, pp:135-144 [Journal]
    
19. Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase
    On Test Data Compression Using Selective Don't-Care Identification. [Citation Graph (0, 0)][DBLP]
    J. Comput. Sci. Technol., 2005, v:20, n:2, pp:210-215 [Journal]
    
20. Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi
    An enhanced fault model for high defect coverage. [Citation Graph (0, 0)][DBLP]
    Systems and Computers in Japan, 2001, v:32, n:6, pp:36-44 [Journal]
    
21. Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki
    Test generation for stuck-on faults in pass-transistor logic SPL and implementation of DFT circuits. [Citation Graph (0, 0)][DBLP]
    Systems and Computers in Japan, 1999, v:30, n:7, pp:55-68 [Journal]
    
22. 
    A Study on Document Structure Recognition of Discharge Summaries for Analogous Case Search System. [Citation Graph (, )][DBLP]
    
    
23. 
    Tendency discovery from incident report map generated by self organizing map and its development. [Citation Graph (, )][DBLP]
    
    
24. 
    An Automatic Recording System of the Plays and Moves of SHOGI Games Using Image Processing Technique. [Citation Graph (, )][DBLP]