The SCEAS System
Navigation Menu

Search the dblp DataBase

Title:
Author:

Hiroshi Takahashi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu
    Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2006, pp:659-664 [Conf]
  2. Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu
    Design of C-Testable Multipliers Based on the Modified Booth Algorithm. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1997, pp:42-47 [Conf]
  3. Keith J. Keller, Hiroshi Takahashi, Kim T. Le, Kewal K. Saluja, Yuzo Takamatsu
    Reduction of Target Fault List for Crosstalk-Induced Delay Faults by using Layout Constraints. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2002, pp:242-247 [Conf]
  4. Yuichi Sato, Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu
    Failure Analysis of Open Faults by Using Detecting/Un-detecting Information on Tests. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:222-227 [Conf]
  5. Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu
    Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1998, pp:108-112 [Conf]
  6. Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Toshiyuki Matsunaga
    A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1997, pp:320-325 [Conf]
  7. Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida
    Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1999, pp:341-346 [Conf]
  8. Hiroshi Takahashi, Marong Phadoongsidhi, Yoshinobu Higami, Kewal K. Saluja, Yuzo Takamatsu
    Simulation-Based Diagnosis for Crosstalk Faults in Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:63-0 [Conf]
  9. Hiroshi Takahashi, Takashi Watanabe, Yuzo Takamatsu
    Generation of tenacious tests for small gate delay faults in combinational circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:332-338 [Conf]
  10. Hiroshi Takahashi, Yukihiro Yamamoto, Yoshinobu Higami, Yuzo Takamatsu
    Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:216-221 [Conf]
  11. Hiroshi Takahashi, Nobuhiro Yanagida, Yuzo Takamatsu
    Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:58-64 [Conf]
  12. Teruhiko Yamada, Toshinori Kotake, Hiroshi Takahashi, Koji Yamazaki
    Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1999, pp:269-274 [Conf]
  13. Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu
    Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1998, pp:237-0 [Conf]
  14. Hiroshi Takahashi, Yasunori Tsugaoka, Hidekazu Ayano, Yuzo Takamatsu
    BIST Based Fault Diagnosis Using Ambiguous Test Set. [Citation Graph (0, 0)][DBLP]
    DFT, 2003, pp:89-96 [Conf]
  15. Hiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato
    Effective Post-BIST Fault Diagnosis for Multiple Faults. [Citation Graph (0, 0)][DBLP]
    DFT, 2006, pp:401-109 [Conf]
  16. Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu
    Multiple Fault Diagnosis in Sequential Circuits Using Sensitizing Sequence Pairs. [Citation Graph (0, 0)][DBLP]
    FTCS, 1996, pp:86-95 [Conf]
  17. I. Matsuba, H. Takahashi, S. Wakasa
    Stochastically Equivalent Dynamical System Approach To Nonlinear Deterministic Prediction. [Citation Graph (0, 0)][DBLP]
    HIS, 2003, pp:409-418 [Conf]
  18. T. Seiyama, Hiroshi Takahashi, Yoshinobu Higami, Kazuo Yamazaki, Yuzo Takamatsu
    On the fault diagnosis in the presence of unknown fault models using pass/fail information. [Citation Graph (0, 0)][DBLP]
    ISCAS (3), 2005, pp:2987-2990 [Conf]
  19. Keith J. Keller, Hiroshi Takahashi, Kewal K. Saluja, Yuzo Takamatsu
    On reducing the target fault list of crosstalk-induced delay faults in synchronous sequential circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:568-577 [Conf]
  20. Jiang Brandon Liu, Andreas G. Veneris, Hiroshi Takahashi
    Incremental Diagnosis of Multiple Open-Interconnects. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1085-1092 [Conf]
  21. Satoru Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda
    An Efficient Learning System for Knowledge of Asset Management. [Citation Graph (0, 0)][DBLP]
    KES, 2004, pp:494-500 [Conf]
  22. Satoru Takahashi, Masakazu Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda
    Learning Value-Added Information of Asset Management from Analyst Reports Through Text Mining. [Citation Graph (0, 0)][DBLP]
    KES (4), 2005, pp:785-791 [Conf]
  23. Satoru Takahashi, Masakazu Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda
    Analysis of Stock Price Return Using Textual Data and Numerical Data Through Text Mining. [Citation Graph (0, 0)][DBLP]
    KES (2), 2006, pp:310-316 [Conf]
  24. Hiroshi Takahashi, Kewal K. Saluja, Yuzo Takamatsu
    An Alternative Method of Generating Tests for Path Delay Faults Using N -Detection Test Sets. [Citation Graph (0, 0)][DBLP]
    PRDC, 2002, pp:275-282 [Conf]
  25. Thomas Clouqueur, Ozen Ercevik, Kewal K. Saluja, Hiroshi Takahashi
    Efficient Signature-Based Fault Diagnosis Using Variable Size Windows. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2001, pp:391-396 [Conf]
  26. Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Yuzo Takamatsu
    Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level Simulation and Test Generation. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2007, pp:781-786 [Conf]
  27. Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu
    General BIST-Amenable Method of Test Generation for Iterative Logic Arrays. [Citation Graph (0, 0)][DBLP]
    VTS, 2000, pp:171-178 [Conf]
  28. Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu
    A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations. [Citation Graph (0, 0)][DBLP]
    VTS, 1999, pp:64-69 [Conf]
  29. Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu
    Multiple Fault Diagnosis by Sensitizing Input Pairs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1995, v:12, n:3, pp:44-52 [Journal]
  30. Satoshi Koizumi, Masayuki Matsushita, Yasufumi Takama, Hiroshi Takahashi, Kaoru Hirota
    Temporal-Hierarchical Emergency-Degree Inference System for Running Vehicles Using Image and Navigation Data. [Citation Graph (0, 0)][DBLP]
    JACIII, 2000, v:4, n:1, pp:76-87 [Journal]
  31. Hiroshi Takahashi
    Vehicle Control Based on Fuzzy Evaluation Knowledge Obtained by Coefficients of the ARMA Model. [Citation Graph (0, 0)][DBLP]
    JACIII, 1997, v:1, n:1, pp:8-9 [Journal]
  32. Hiroshi Takahashi, Kouichi Kuroda
    Study on Intelligent Vehicle Control Considering Driver Perception of Driving Environment. [Citation Graph (0, 0)][DBLP]
    JACIII, 1999, v:3, n:1, pp:42-49 [Journal]
  33. Hiroshi Takahashi, Takao Terano
    Agent-Based Approach to Investors' Behavior and Asset Price Fluctuation in Financial Markets. [Citation Graph (0, 0)][DBLP]
    J. Artificial Societies and Social Simulation, 2003, v:6, n:3, pp:- [Journal]
  34. Hiroshi Takahashi, Takashi Watanabe, Toshiyuki Matsunaga, Yuzo Takamatsu
    Tests for small gate delay faults in combinational circuits and a test generation method. [Citation Graph (0, 0)][DBLP]
    Systems and Computers in Japan, 1997, v:28, n:6, pp:68-76 [Journal]
  35. Hiroshi Takahashi, Kwame Osei Boateng, Kewal K. Saluja, Yuzo Takamatsu
    On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:3, pp:362-368 [Journal]
  36. Hiroshi Takahashi, Keith J. Keller, Kim T. Le, Kewal K. Saluja, Yuzo Takamatsu
    A method for reducing the target fault list of crosstalk faults in synchronous sequential circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:2, pp:252-263 [Journal]
  37. Satoru Takahashi, Masakazu Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda
    Analysis of the Relation Between Stock Price Returns and Headline News Using Text Categorization. [Citation Graph (0, 0)][DBLP]
    KES (2), 2007, pp:1339-1345 [Conf]

  38. New Class of Tests for Open Faults with Considering Adjacent Lines. [Citation Graph (, )][DBLP]


  39. Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. [Citation Graph (, )][DBLP]


  40. Timing-Aware Diagnosis for Small Delay Defects. [Citation Graph (, )][DBLP]


  41. A Study on a Method to Call Drivers' Attention to Hazard. [Citation Graph (, )][DBLP]


  42. Analyzing the Influence of Overconfident Investors on Financial Markets Through Agent-Based Model. [Citation Graph (, )][DBLP]


  43. The Development of the Financial Learning Tool through Business Game. [Citation Graph (, )][DBLP]


  44. A Novel Approach for Improving the Quality of Open Fault Diagnosis. [Citation Graph (, )][DBLP]


  45. Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. [Citation Graph (, )][DBLP]


  46. Analysis on the resistive forces acting on the bucket of a Load-Haul-Dump machine and a wheel loader in the scooping task. [Citation Graph (, )][DBLP]


Search in 0.000secs, Finished in 0.002secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002