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Hiroshi Takahashi :
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Yoshinobu Higami , Kewal K. Saluja , Hiroshi Takahashi , Shin-ya Kobayashi , Yuzo Takamatsu Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits. [Citation Graph (0, 0)][DBLP ] ASP-DAC, 2006, pp:659-664 [Conf ] Kwame Osei Boateng , Hiroshi Takahashi , Yuzo Takamatsu Design of C-Testable Multipliers Based on the Modified Booth Algorithm. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 1997, pp:42-47 [Conf ] Keith J. Keller , Hiroshi Takahashi , Kim T. Le , Kewal K. Saluja , Yuzo Takamatsu Reduction of Target Fault List for Crosstalk-Induced Delay Faults by using Layout Constraints. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 2002, pp:242-247 [Conf ] Yuichi Sato , Hiroshi Takahashi , Yoshinobu Higami , Yuzo Takamatsu Failure Analysis of Open Faults by Using Detecting/Un-detecting Information on Tests. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 2004, pp:222-227 [Conf ] Hiroshi Takahashi , Kwame Osei Boateng , Yuzo Takamatsu Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 1998, pp:108-112 [Conf ] Hiroshi Takahashi , Kwame Osei Boateng , Yuzo Takamatsu , Toshiyuki Matsunaga A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 1997, pp:320-325 [Conf ] Hiroshi Takahashi , Kwame Osei Boateng , Yuzo Takamatsu , Nobuhiro Yanagida Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 1999, pp:341-346 [Conf ] Hiroshi Takahashi , Marong Phadoongsidhi , Yoshinobu Higami , Kewal K. Saluja , Yuzo Takamatsu Simulation-Based Diagnosis for Crosstalk Faults in Sequential Circuits. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 2001, pp:63-0 [Conf ] Hiroshi Takahashi , Takashi Watanabe , Yuzo Takamatsu Generation of tenacious tests for small gate delay faults in combinational circuits. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 1995, pp:332-338 [Conf ] Hiroshi Takahashi , Yukihiro Yamamoto , Yoshinobu Higami , Yuzo Takamatsu Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 2004, pp:216-221 [Conf ] Hiroshi Takahashi , Nobuhiro Yanagida , Yuzo Takamatsu Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 1995, pp:58-64 [Conf ] Teruhiko Yamada , Toshinori Kotake , Hiroshi Takahashi , Koji Yamazaki Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 1999, pp:269-274 [Conf ] Nobuhiro Yanagida , Hiroshi Takahashi , Yuzo Takamatsu Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 1998, pp:237-0 [Conf ] Hiroshi Takahashi , Yasunori Tsugaoka , Hidekazu Ayano , Yuzo Takamatsu BIST Based Fault Diagnosis Using Ambiguous Test Set. [Citation Graph (0, 0)][DBLP ] DFT, 2003, pp:89-96 [Conf ] Hiroshi Takahashi , Shuhei Kadoyama , Yoshinobu Higami , Yuzo Takamatsu , Koji Yamazaki , Takashi Aikyo , Yasuo Sato Effective Post-BIST Fault Diagnosis for Multiple Faults. [Citation Graph (0, 0)][DBLP ] DFT, 2006, pp:401-109 [Conf ] Nobuhiro Yanagida , Hiroshi Takahashi , Yuzo Takamatsu Multiple Fault Diagnosis in Sequential Circuits Using Sensitizing Sequence Pairs. [Citation Graph (0, 0)][DBLP ] FTCS, 1996, pp:86-95 [Conf ] I. Matsuba , H. Takahashi , S. Wakasa Stochastically Equivalent Dynamical System Approach To Nonlinear Deterministic Prediction. [Citation Graph (0, 0)][DBLP ] HIS, 2003, pp:409-418 [Conf ] T. Seiyama , Hiroshi Takahashi , Yoshinobu Higami , Kazuo Yamazaki , Yuzo Takamatsu On the fault diagnosis in the presence of unknown fault models using pass/fail information. [Citation Graph (0, 0)][DBLP ] ISCAS (3), 2005, pp:2987-2990 [Conf ] Keith J. Keller , Hiroshi Takahashi , Kewal K. Saluja , Yuzo Takamatsu On reducing the target fault list of crosstalk-induced delay faults in synchronous sequential circuits. [Citation Graph (0, 0)][DBLP ] ITC, 2001, pp:568-577 [Conf ] Jiang Brandon Liu , Andreas G. Veneris , Hiroshi Takahashi Incremental Diagnosis of Multiple Open-Interconnects. [Citation Graph (0, 0)][DBLP ] ITC, 2002, pp:1085-1092 [Conf ] Satoru Takahashi , Hiroshi Takahashi , Kazuhiko Tsuda An Efficient Learning System for Knowledge of Asset Management. [Citation Graph (0, 0)][DBLP ] KES, 2004, pp:494-500 [Conf ] Satoru Takahashi , Masakazu Takahashi , Hiroshi Takahashi , Kazuhiko Tsuda Learning Value-Added Information of Asset Management from Analyst Reports Through Text Mining. [Citation Graph (0, 0)][DBLP ] KES (4), 2005, pp:785-791 [Conf ] Satoru Takahashi , Masakazu Takahashi , Hiroshi Takahashi , Kazuhiko Tsuda Analysis of Stock Price Return Using Textual Data and Numerical Data Through Text Mining. [Citation Graph (0, 0)][DBLP ] KES (2), 2006, pp:310-316 [Conf ] Hiroshi Takahashi , Kewal K. Saluja , Yuzo Takamatsu An Alternative Method of Generating Tests for Path Delay Faults Using N -Detection Test Sets. [Citation Graph (0, 0)][DBLP ] PRDC, 2002, pp:275-282 [Conf ] Thomas Clouqueur , Ozen Ercevik , Kewal K. Saluja , Hiroshi Takahashi Efficient Signature-Based Fault Diagnosis Using Variable Size Windows. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2001, pp:391-396 [Conf ] Yoshinobu Higami , Kewal K. Saluja , Hiroshi Takahashi , Yuzo Takamatsu Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level Simulation and Test Generation. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2007, pp:781-786 [Conf ] Kwame Osei Boateng , Hiroshi Takahashi , Yuzo Takamatsu General BIST-Amenable Method of Test Generation for Iterative Logic Arrays. [Citation Graph (0, 0)][DBLP ] VTS, 2000, pp:171-178 [Conf ] Hiroshi Takahashi , Kwame Osei Boateng , Yuzo Takamatsu A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations. [Citation Graph (0, 0)][DBLP ] VTS, 1999, pp:64-69 [Conf ] Nobuhiro Yanagida , Hiroshi Takahashi , Yuzo Takamatsu Multiple Fault Diagnosis by Sensitizing Input Pairs. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1995, v:12, n:3, pp:44-52 [Journal ] Satoshi Koizumi , Masayuki Matsushita , Yasufumi Takama , Hiroshi Takahashi , Kaoru Hirota Temporal-Hierarchical Emergency-Degree Inference System for Running Vehicles Using Image and Navigation Data. [Citation Graph (0, 0)][DBLP ] JACIII, 2000, v:4, n:1, pp:76-87 [Journal ] Hiroshi Takahashi Vehicle Control Based on Fuzzy Evaluation Knowledge Obtained by Coefficients of the ARMA Model. [Citation Graph (0, 0)][DBLP ] JACIII, 1997, v:1, n:1, pp:8-9 [Journal ] Hiroshi Takahashi , Kouichi Kuroda Study on Intelligent Vehicle Control Considering Driver Perception of Driving Environment. [Citation Graph (0, 0)][DBLP ] JACIII, 1999, v:3, n:1, pp:42-49 [Journal ] Hiroshi Takahashi , Takao Terano Agent-Based Approach to Investors' Behavior and Asset Price Fluctuation in Financial Markets. [Citation Graph (0, 0)][DBLP ] J. Artificial Societies and Social Simulation, 2003, v:6, n:3, pp:- [Journal ] Hiroshi Takahashi , Takashi Watanabe , Toshiyuki Matsunaga , Yuzo Takamatsu Tests for small gate delay faults in combinational circuits and a test generation method. [Citation Graph (0, 0)][DBLP ] Systems and Computers in Japan, 1997, v:28, n:6, pp:68-76 [Journal ] Hiroshi Takahashi , Kwame Osei Boateng , Kewal K. Saluja , Yuzo Takamatsu On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:3, pp:362-368 [Journal ] Hiroshi Takahashi , Keith J. Keller , Kim T. Le , Kewal K. Saluja , Yuzo Takamatsu A method for reducing the target fault list of crosstalk faults in synchronous sequential circuits. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:2, pp:252-263 [Journal ] Satoru Takahashi , Masakazu Takahashi , Hiroshi Takahashi , Kazuhiko Tsuda Analysis of the Relation Between Stock Price Returns and Headline News Using Text Categorization. [Citation Graph (0, 0)][DBLP ] KES (2), 2007, pp:1339-1345 [Conf ] New Class of Tests for Open Faults with Considering Adjacent Lines. [Citation Graph (, )][DBLP ] Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. [Citation Graph (, )][DBLP ] Timing-Aware Diagnosis for Small Delay Defects. [Citation Graph (, )][DBLP ] A Study on a Method to Call Drivers' Attention to Hazard. [Citation Graph (, )][DBLP ] Analyzing the Influence of Overconfident Investors on Financial Markets Through Agent-Based Model. [Citation Graph (, )][DBLP ] The Development of the Financial Learning Tool through Business Game. [Citation Graph (, )][DBLP ] A Novel Approach for Improving the Quality of Open Fault Diagnosis. [Citation Graph (, )][DBLP ] Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. [Citation Graph (, )][DBLP ] Analysis on the resistive forces acting on the bucket of a Load-Haul-Dump machine and a wheel loader in the scooping task. [Citation Graph (, )][DBLP ] Search in 0.003secs, Finished in 0.342secs