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Rei-Fu Huang: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Rei-Fu Huang, Yan-Ting Lai, Yung-Fa Chou, Cheng-Wen Wu
    SRAM delay fault modeling and test algorithm development. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2004, pp:104-109 [Conf]
  2. Rei-Fu Huang, Yung-Fa Chou, Cheng-Wen Wu
    Defect Oriented Fault Analysis for SRAM. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:256-261 [Conf]
  3. Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang
    Fail Pattern Identification for Memory Built-In Self-Repair. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:366-371 [Conf]
  4. Chih-Tsun Huang, Jen-Chieh Yeh, Yuan-Yuan Shih, Rei-Fu Huang, Cheng-Wen Wu
    On Test and Diagnostics of Flash Memories. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:260-265 [Conf]
  5. Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu
    A Processor-Based Built-In Self-Repair Design for Embedded Memories. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:366-371 [Conf]
  6. Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu
    A Simulator for E aluating Redundancy Analysis Algorithms of Repairable Embedded Memories. [Citation Graph (0, 0)][DBLP]
    IOLTW, 2002, pp:262-0 [Conf]
  7. Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu, Peir-Yuan Tsai, Archer Hsu, Eugene Chow
    A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:393-402 [Conf]
  8. Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu
    MRAM Defect Analysis and Fault Modeli. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:124-133 [Conf]
  9. Li-Ming Denq, Rei-Fu Huang, Cheng-Wen Wu, Yeong-Jar Chang, Wen Ching Wu
    A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories. [Citation Graph (0, 0)][DBLP]
    MTDT, 2004, pp:65-69 [Conf]
  10. Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu Li
    A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories. [Citation Graph (0, 0)][DBLP]
    MTDT, 2003, pp:53-0 [Conf]
  11. Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu
    A Simulator for Evaluating Redundancy Analysis Algorithms of Repairable Embedded Memories. [Citation Graph (0, 0)][DBLP]
    MTDT, 2002, pp:68-0 [Conf]
  12. Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu
    A built-in self-repair design for RAMs with 2-D redundancy. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2005, v:13, n:6, pp:742-745 [Journal]

  13. Fault models for embedded-DRAM macros. [Citation Graph (, )][DBLP]


  14. Economic Aspects of Memory Built-in Self-Repair. [Citation Graph (, )][DBLP]


  15. Raisin: Redundancy Analysis Algorithm Simulation. [Citation Graph (, )][DBLP]


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