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Yahya Zaidan: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Yu Huang, Sudhakar M. Reddy, Nilanjan Mukherjee, Chien-Chung Tsai, Omer Samman, Yahya Zaidan, Yanping Zhang, Wu-Tung Cheng
    Constraint Driven Pin Mapping for Concurrent SOC Testing. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2002, pp:511-516 [Conf]
  2. Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanjan Mukherjee, Omer Samman, Yahya Zaidan, Sudhakar M. Reddy
    Resource Allocation and Test Scheduling for Concurrent Test of Core-Based SoC D. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:265-0 [Conf]
  3. Yu Huang, Sudhakar M. Reddy, Wu-Tung Cheng, Paul Reuter, Nilanjan Mukherjee, Chien-Chung Tsai, Omer Samman, Yahya Zaidan
    Optimal Core Wrapper Width Selection and SOC Test Scheduling Based on 3-D Bin Packing Algorithm. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:74-82 [Conf]
  4. Yu Huang, Nilanjan Mukherjee, Chien-Chung Tsai, Omer Samman, Yahya Zaidan, Yanping Zhang, Wu-Tung Cheng, Sudhakar M. Reddy
    Constraint Driven Pin Mapping for Concurrent SOC Testing. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2002, pp:511-516 [Conf]

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