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Takumi Uezono: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Junpei Inoue, Hiroyuki Ito, Shinichiro Gomi, Takanori Kyogoku, Takumi Uezono, Kenichi Okada, Kazuya Masu
    Evaluation of on-chip transmission line interconnect using wire length distribution. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2005, pp:133-138 [Conf]
  2. Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu
    Improvement of power distribution network using correlation-based regression analysis. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2007, pp:513-516 [Conf]
  3. Takumi Uezono, Kenichi Okada, Kazuya Masu
    Via Distribution Model for Yield Estimation. [Citation Graph (0, 0)][DBLP]
    ISQED, 2006, pp:479-484 [Conf]
  4. Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu
    A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation. [Citation Graph (0, 0)][DBLP]
    ISQED, 2007, pp:21-26 [Conf]
  5. Takanori Kyogoku, Junpei Inoue, Hidenari Nakashima, Takumi Uezono, Kenichi Okada, Kazuya Masu
    Wire Length Distribution Model Considering Core Utilization for System on Chip. [Citation Graph (0, 0)][DBLP]
    ISVLSI, 2005, pp:276-277 [Conf]
  6. Kenichi Okada, Takumi Uezono, Kazuya Masu
    Estimation of Power Reduction by On-Chip Transmission Line for 45nm Technology. [Citation Graph (0, 0)][DBLP]
    PATMOS, 2006, pp:181-190 [Conf]
  7. Takumi Uezono, Junpei Inoue, Takanori Kyogoku, Kenichi Okada, Kazuya Masu
    Prediction of delay time for future LSI using on-chip transmission line interconnects. [Citation Graph (0, 0)][DBLP]
    SLIP, 2005, pp:7-12 [Conf]
  8. Takashi Sato, Shiho Hagiwara, Takumi Uezono, Kazuya Masu
    Weakness Identification for Effective Repair of Power Distribution Network. [Citation Graph (0, 0)][DBLP]
    PATMOS, 2007, pp:222-231 [Conf]
  9. Shuhei Amakawa, Takumi Uezono, Takashi Sato, Kenichi Okada, Kazuya Masu
    Adaptable wire-length distribution with tunable occupation probability. [Citation Graph (0, 0)][DBLP]
    SLIP, 2007, pp:1-8 [Conf]

  10. An Adaptive Test for Parametric Faults Based on Statistical Timing Information. [Citation Graph (, )][DBLP]

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