The SCEAS System
Navigation Menu

Search the dblp DataBase

Title:
Author:

Takumi Uezono: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Junpei Inoue, Hiroyuki Ito, Shinichiro Gomi, Takanori Kyogoku, Takumi Uezono, Kenichi Okada, Kazuya Masu
    Evaluation of on-chip transmission line interconnect using wire length distribution. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2005, pp:133-138 [Conf]
  2. Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu
    Improvement of power distribution network using correlation-based regression analysis. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2007, pp:513-516 [Conf]
  3. Takumi Uezono, Kenichi Okada, Kazuya Masu
    Via Distribution Model for Yield Estimation. [Citation Graph (0, 0)][DBLP]
    ISQED, 2006, pp:479-484 [Conf]
  4. Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu
    A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation. [Citation Graph (0, 0)][DBLP]
    ISQED, 2007, pp:21-26 [Conf]
  5. Takanori Kyogoku, Junpei Inoue, Hidenari Nakashima, Takumi Uezono, Kenichi Okada, Kazuya Masu
    Wire Length Distribution Model Considering Core Utilization for System on Chip. [Citation Graph (0, 0)][DBLP]
    ISVLSI, 2005, pp:276-277 [Conf]
  6. Kenichi Okada, Takumi Uezono, Kazuya Masu
    Estimation of Power Reduction by On-Chip Transmission Line for 45nm Technology. [Citation Graph (0, 0)][DBLP]
    PATMOS, 2006, pp:181-190 [Conf]
  7. Takumi Uezono, Junpei Inoue, Takanori Kyogoku, Kenichi Okada, Kazuya Masu
    Prediction of delay time for future LSI using on-chip transmission line interconnects. [Citation Graph (0, 0)][DBLP]
    SLIP, 2005, pp:7-12 [Conf]
  8. Takashi Sato, Shiho Hagiwara, Takumi Uezono, Kazuya Masu
    Weakness Identification for Effective Repair of Power Distribution Network. [Citation Graph (0, 0)][DBLP]
    PATMOS, 2007, pp:222-231 [Conf]
  9. Shuhei Amakawa, Takumi Uezono, Takashi Sato, Kenichi Okada, Kazuya Masu
    Adaptable wire-length distribution with tunable occupation probability. [Citation Graph (0, 0)][DBLP]
    SLIP, 2007, pp:1-8 [Conf]

  10. An Adaptive Test for Parametric Faults Based on Statistical Timing Information. [Citation Graph (, )][DBLP]


Search in 0.003secs, Finished in 0.004secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002