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Hitoshi Yamanaka:
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Publications of Author
- Noriyuki Ito, Akira Kanuma, Daisuke Maruyama, Hitoshi Yamanaka, Tsuyoshi Mochizuki, Osamu Sugawara, Chihiro Endoh, Masahiro Yanagida, Takeshi Kono, Yutaka Isoda, Kazunobu Adachi, Takahisa Hiraide, Shigeru Nagasawa, Yaroku Sugiyama, Eizo Ninoi
Delay defect screening for a 2.16GHz SPARC64 microprocessor. [Citation Graph (0, 0)][DBLP] ASP-DAC, 2006, pp:342-347 [Conf]
- Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama
BIST-Aided Scan Test - A New Method for Test Cost Reduction. [Citation Graph (0, 0)][DBLP] VTS, 2003, pp:359-364 [Conf]
Design Methodology for 2.4GHz Dual-Core Microprocessor. [Citation Graph (, )][DBLP]
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