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Yoshiyuki Kawakami: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Yoshiyuki Kawakami, Jingkun Fang, Hirokazu Yonezawa, Nobufusa Iwanishi, Lifeng Wu, Alvin I-Hsien Chen, Norio Koike, Ping Chen, Chune-Sin Yeh, Zhihong Liu
    Gate-level aged timing simulation methodology for hot-carrier reliability assurance. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2000, pp:289-294 [Conf]
  2. Lifeng Wu, Jingkun Fang, Heting Yan, Ping Chen, Alvin I-Hsien Chen, Yoshifumi Okamoto, Chune-Sin Yeh, Zhihong Liu, Nobufusa Iwanishi, Norio Koike, Hirokazu Yonezawa, Yoshiyuki Kawakami
    GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design. [Citation Graph (0, 0)][DBLP]
    ISQED, 2000, pp:73-80 [Conf]

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