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Publications of Author

1. Katherine Shu-Min Li, Yao-Wen Chang, Chauchin Su, Chung-Len Lee, Jwu E. Chen
   IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. [Citation Graph (0, 0)][DBLP]
   ASP-DAC, 2006, pp:366-371 [Conf]
   
2. Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen
   Oscillation ring based interconnect test scheme for SOC. [Citation Graph (0, 0)][DBLP]
   ASP-DAC, 2005, pp:184-187 [Conf]
   
3. Katherine Shu-Min Li, Chung-Len Lee, Tagin Jiang, Chauchin Su, Jwu E. Chen
   Finite State Machine Synthesis for At-Speed Oscillation Testability. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2005, pp:360-365 [Conf]
   
4. Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen
   A Unified Approach to Detecting Crosstalk Faults of Interconnects in Deep Sub-Micron VLSI. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2004, pp:145-150 [Conf]
   
5. Katherine Shu-Min Li, Chung-Len Lee, Yao-Wen Chang, Chauchin Su, Jwu E. Chen
   Multilevel full-chip routing with testability and yield enhancement. [Citation Graph (0, 0)][DBLP]
   SLIP, 2005, pp:29-36 [Conf]
   
6. Katherine Shu-Min Li, Chauchin Su, Yao-Wen Chang, Chung-Len Lee, Jwu E. Chen
   IEEE Standard 1500 Compatible Interconnect Diagnosis for Delay and Crosstalk Faults. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:11, pp:2513-2525 [Journal]
   
7. Sying-Jyan Wang, Yan-Ting Chen, Katherine Shu-Min Li
   Low Capture Power Test Generation for Launch-off-Capture Transition Test Based on Don't-Care Filling. [Citation Graph (0, 0)][DBLP]
   ISCAS, 2007, pp:3683-3686 [Conf]
   
8. Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen
   IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:4, pp:341-355 [Journal]
   
9. 
   Temperature-aware dynamic frequency and voltage scaling for reliability and yield enhancement. [Citation Graph (, )][DBLP]
   
   
10. 
    IEEE 1500 Compatible Interconnect Test with Maximal Test Concurrency. [Citation Graph (, )][DBLP]
    
    
11. 
    Multiple Scan Trees Synthesis for Test Time/Data and Routing Length Reduction under Output Constraint. [Citation Graph (, )][DBLP]
    
    
12. 
    Design and analysis of skewed-distribution scan chain partition for improved test data compression. [Citation Graph (, )][DBLP]