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Angela Krstic:
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Publications of Author
- Jing-Jia Liou, Angela Krstic, Kwang-Ting Cheng, Deb Aditya Mukherjee, Sandip Kundu
Performance sensitivity analysis using statistical method and its applications to delay. [Citation Graph (0, 0)][DBLP] ASP-DAC, 2000, pp:587-592 [Conf]
- Yi-Min Jiang, Angela Krstic, Kwang-Ting Cheng, Malgorzata Marek-Sadowska
Post-Layout Logic Restructuring for Performance Optimization. [Citation Graph (0, 0)][DBLP] DAC, 1997, pp:662-665 [Conf]
- Angela Krstic, Kwang-Ting Cheng
Vector Generation for Maximum Instantaneous Current Through Supply Lines for CMOS Circuits. [Citation Graph (0, 0)][DBLP] DAC, 1997, pp:383-388 [Conf]
- Angela Krstic, Wei-Cheng Lai, Kwang-Ting Cheng, Li Chen, Sujit Dey
Embedded software-based self-testing for SoC design. [Citation Graph (0, 0)][DBLP] DAC, 2002, pp:355-360 [Conf]
- Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, T. M. Mak
Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models. [Citation Graph (0, 0)][DBLP] DAC, 2003, pp:668-673 [Conf]
- Jing-Jia Liou, Kwang-Ting Cheng, Sandip Kundu, Angela Krstic
Fast Statistical Timing Analysis By Probabilistic Event Propagation. [Citation Graph (0, 0)][DBLP] DAC, 2001, pp:661-666 [Conf]
- Jing-Jia Liou, Angela Krstic, Li-C. Wang, Kwang-Ting Cheng
False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation. [Citation Graph (0, 0)][DBLP] DAC, 2002, pp:566-569 [Conf]
- Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, Magdy S. Abadir
Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step. [Citation Graph (0, 0)][DBLP] DATE, 2003, pp:10328-10335 [Conf]
- Jing-Jia Liou, Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng
Path Selection and Pattern Generation for Dynamic Timing Analysis Considering Power Supply Noise Effects. [Citation Graph (0, 0)][DBLP] ICCAD, 2000, pp:493-496 [Conf]
- Yi-Min Jiang, Angela Krstic, Kwang-Ting Cheng
Dynamic Timing Analysis Considering Power Supply Noise Effects. [Citation Graph (0, 0)][DBLP] ISQED, 2000, pp:137-144 [Conf]
- Angela Krstic, Jing-Jia Liou, Kwang-Ting Cheng, Li-C. Wang
On Structural vs. Functional Testing for Delay Faults. [Citation Graph (0, 0)][DBLP] ISQED, 2003, pp:438-441 [Conf]
- Xiaoliang Bai, Sujit Dey, Angela Krstic
HyAC: A Hybrid Structural SAT Based ATPG for Crosstalk. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:112-121 [Conf]
- Yi-Min Jiang, Angela Krstic, Kwang-Ting Cheng
Delay testing considering power supply noise effects. [Citation Graph (0, 0)][DBLP] ITC, 1999, pp:181-190 [Conf]
- Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar
Identification and Test Generation for Primitive Faults. [Citation Graph (0, 0)][DBLP] ITC, 1996, pp:423-432 [Conf]
- Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar
Design for Primitive Delay Fault Testability. [Citation Graph (0, 0)][DBLP] ITC, 1997, pp:436-445 [Conf]
- Angela Krstic, Jing-Jia Liou, Yi-Min Jiang, Kwang-Ting Cheng
Delay testing considering crosstalk-induced effects. [Citation Graph (0, 0)][DBLP] ITC, 2001, pp:558-567 [Conf]
- Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M. Mak
Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:339-348 [Conf]
- Wei-Cheng Lai, Angela Krstic, Kwang-Ting Cheng
Test program synthesis for path delay faults in microprocessor cores. [Citation Graph (0, 0)][DBLP] ITC, 2000, pp:1080-1089 [Conf]
- Li-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting Cheng, M. Ray Mercer, Thomas W. Williams, Magdy S. Abadir
Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:1041-1050 [Conf]
- Angela Krstic, Kwang-Ting Cheng
Generation of high quality tests for functional sensitizable paths. [Citation Graph (0, 0)][DBLP] VTS, 1995, pp:374-379 [Conf]
- Angela Krstic, Kwang-Ting (Tim) Cheng, Srimat T. Chakradhar
Testing High Speed VLSI Devices Using Slower Testers. [Citation Graph (0, 0)][DBLP] VTS, 1999, pp:16-21 [Conf]
- Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou
Diagnosis of Delay Defects Using Statistical Timing Models. [Citation Graph (0, 0)][DBLP] VTS, 2003, pp:339-344 [Conf]
- Wei-Cheng Lai, Angela Krstic, Kwang-Ting Cheng
On Testing the Path Delay Faults of a Microprocessor Using its Instruction Set. [Citation Graph (0, 0)][DBLP] VTS, 2000, pp:15-22 [Conf]
- Kwang-Ting Cheng, Angela Krstic
Current Directions in Automatic Test-Pattern Generation. [Citation Graph (0, 0)][DBLP] IEEE Computer, 1999, v:32, n:11, pp:58-64 [Journal]
- Angela Krstic, Wei-Cheng Lai, Kwang-Ting Cheng, Li Chen, Sujit Dey
Embedded Software-Based Self-Test for Programmable Core-Based Designs. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2002, v:19, n:4, pp:18-27 [Journal]
- Wei-Cheng Lai, Angela Krstic, Kwang-Ting (Tim) Cheng
Functionally Testable Path Delay Faults on a Microprocessor. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:6-14 [Journal]
- T. M. Mak, Angela Krstic, Kwang-Ting (Tim) Cheng, Li-C. Wang
New Challenges in Delay Testing of Nanometer, Multigigahertz Designs. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2004, v:21, n:3, pp:241-247 [Journal]
- Angela Krstic, Srimat T. Chakradhar, Kwang-Ting Cheng
Testable Path Delay Fault Cover for Sequential Circuits. [Citation Graph (0, 0)][DBLP] J. Inf. Sci. Eng., 2000, v:16, n:5, pp:673-686 [Journal]
- Kwang-Ting Cheng, Angela Krstic, Hsi-Chuan Chen
Generation of High Quality Tests for Robustly Untestable Path Delay Faults. [Citation Graph (0, 0)][DBLP] IEEE Trans. Computers, 1996, v:45, n:12, pp:1379-1392 [Journal]
- Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar
Primitive delay faults: identification, testing, and design for testability. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:6, pp:669-684 [Journal]
- Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng
Pattern generation for delay testing and dynamic timing analysisconsidering power-supply noise effects. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2001, v:20, n:3, pp:416-425 [Journal]
- Jing-Jia Liou, Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng
Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:6, pp:756-769 [Journal]
- Yi-Min Jiang, Angela Krstic, Kwang-Ting Cheng
Estimation for maximum instantaneous current through supply lines for CMOS circuits. [Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2000, v:8, n:1, pp:61-73 [Journal]
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