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Sule Ozev: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Fang Liu, Sule Ozev
    Hierarchical analysis of process variation for mixed-signal systems. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2005, pp:465-470 [Conf]
  2. Jonathan R. Carter, Sule Ozev, Daniel J. Sorin
    Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown. [Citation Graph (0, 0)][DBLP]
    DATE, 2005, pp:300-305 [Conf]
  3. Fang Liu, Jacob J. Flomenberg, Devaka V. Yasaratne, Sule Ozev
    Hierarchical Variance Analysis for Analog Circuits Based on Graph Modelling and Correlation Loop Tracing. [Citation Graph (0, 0)][DBLP]
    DATE, 2005, pp:126-131 [Conf]
  4. Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu
    Test Synthesis for Mixed-Signal SOC Paths. [Citation Graph (0, 0)][DBLP]
    DATE, 2000, pp:128-133 [Conf]
  5. Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty
    Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores. [Citation Graph (0, 0)][DBLP]
    DATE, 2005, pp:50-55 [Conf]
  6. Sule Ozev, Alex Orailoglu
    Low-Cost Test for Large Analog IC's. [Citation Graph (0, 0)][DBLP]
    DFT, 1999, pp:101-0 [Conf]
  7. Fred A. Bower, Paul G. Shealy, Sule Ozev, Daniel J. Sorin
    Tolerating Hard Faults in Microprocessor Array Structures. [Citation Graph (0, 0)][DBLP]
    DSN, 2004, pp:51-60 [Conf]
  8. Erkan Acar, Sule Ozev
    Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2005, pp:73-79 [Conf]
  9. Fang Liu, Sule Ozev, Martin A. Brooke
    Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2004, pp:641-647 [Conf]
  10. Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty
    TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2003, pp:95-99 [Conf]
  11. Erkan Acar, Sule Ozev, Kevin B. Redmond
    Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2006, pp:210-216 [Conf]
  12. Fang Liu, Sule Ozev
    Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits. [Citation Graph (0, 0)][DBLP]
    ICCD, 2005, pp:161-170 [Conf]
  13. Sule Ozev, Alex Orailoglu
    Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits. [Citation Graph (0, 0)][DBLP]
    ICCD, 2002, pp:258-264 [Conf]
  14. Sule Ozev, Alex Orailoglu
    End-to-End Testability Analysis and DfT Insertion for Mixed-Signal Paths. [Citation Graph (0, 0)][DBLP]
    ICCD, 2004, pp:72-77 [Conf]
  15. Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty
    A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs. [Citation Graph (0, 0)][DBLP]
    ICCD, 2005, pp:137-142 [Conf]
  16. Sule Ozev, Alex Orailoglu, Hosam Haggag
    Automated test development and test time reduction for RF subsystems. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2002, pp:581-584 [Conf]
  17. Sule Ozev, Alex Orailoglu
    An Integrated Tool for Analog Test Generation and Fault Simulation. [Citation Graph (0, 0)][DBLP]
    ISQED, 2002, pp:267-272 [Conf]
  18. Erkan Acar, Sule Ozev
    Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:783-792 [Conf]
  19. Christian Olgaard, Sule Ozev, Alex Orailoglu
    Testability implications in low-cost integrated radio transceivers: a Bluetooth case study. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:965-974 [Conf]
  20. Fei Su, Sule Ozev, Krishnendu Chakrabarty
    Testing of Droplet-Based Microelectrofluidic Systems. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:1192-1200 [Conf]
  21. Fred A. Bower, Daniel J. Sorin, Sule Ozev
    A Mechanism for Online Diagnosis of Hard Faults in Microprocessors. [Citation Graph (0, 0)][DBLP]
    MICRO, 2005, pp:197-208 [Conf]
  22. Fred A. Bower, Derek Hower, Mahmut Yilmaz, Daniel J. Sorin, Sule Ozev
    Applying architectural vulnerability Analysis to hard faults in the microprocessor. [Citation Graph (0, 0)][DBLP]
    SIGMETRICS/Performance, 2006, pp:375-376 [Conf]
  23. Erkan Acar, Sule Ozev
    Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements. [Citation Graph (0, 0)][DBLP]
    VTS, 2005, pp:374-379 [Conf]
  24. Fang Liu, Plamen K. Nikolov, Sule Ozev
    Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:272-277 [Conf]
  25. Sule Ozev, Alex Orailoglu
    Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems. [Citation Graph (0, 0)][DBLP]
    VTS, 2000, pp:149-156 [Conf]
  26. Sule Ozev, Alex Orailoglu
    Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:213-222 [Conf]
  27. Sule Ozev, Christian Olgaard
    Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:217-222 [Conf]
  28. Erkan Acar, Sule Ozev, Kevin B. Redmond
    A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:3-8 [Conf]
  29. Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu
    Seamless Test of Digital Components in Mixed-Signal Paths. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:1, pp:44-55 [Journal]
  30. Sule Ozev, Christian Olgaard, Alex Orailoglu
    Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:5, pp:82-91 [Journal]
  31. Fang Liu, Sule Ozev, Martin A. Brooke
    Identifying the Source of BW Failures in High-Frequency Linear Analog Circuits Based on S-Parameter Measurements. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:11, pp:2594-2605 [Journal]
  32. Fred A. Bower, Sule Ozev, Daniel J. Sorin
    Autonomic Microprocessor Execution via Self-Repairing Arrays. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Dependable Sec. Comput., 2005, v:2, n:4, pp:297-310 [Journal]
  33. Fei Su, Sule Ozev, Krishnendu Chakrabarty
    Concurrent testing of digital microfluidics-based biochips. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 2006, v:11, n:2, pp:442-464 [Journal]
  34. Sule Ozev, Alex Orailoglu
    Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2004, v:12, n:7, pp:756-765 [Journal]
  35. Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty
    Test infrastructure design for mixed-signal SOCs with wrapped analog cores. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2006, v:14, n:3, pp:292-304 [Journal]
  36. Erdem S. Erdogan, Sule Ozev
    An ADC-BiST scheme using sequential code analysis. [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:713-718 [Conf]
  37. Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty
    Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores [Citation Graph (0, 0)][DBLP]
    CoRR, 2007, v:0, n:, pp:- [Journal]
  38. Jonathan R. Carter, Sule Ozev, Daniel J. Sorin
    Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown [Citation Graph (0, 0)][DBLP]
    CoRR, 2007, v:0, n:, pp:- [Journal]
  39. Fred A. Bower, Daniel J. Sorin, Sule Ozev
    Online diagnosis of hard faults in microprocessors. [Citation Graph (0, 0)][DBLP]
    TACO, 2007, v:4, n:2, pp:- [Journal]
  40. Erkan Acar, Sule Ozev
    Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2007, v:15, n:1, pp:37-47 [Journal]
  41. Fei Su, Sule Ozev, Krishnendu Chakrabarty
    Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:2, pp:199-210 [Journal]

  42. Reducing the Impact of Process Variability with Prefetching and Criticality-Based Resource Allocation. [Citation Graph (, )][DBLP]


  43. AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs. [Citation Graph (, )][DBLP]


  44. Reducing the impact of intra-core process variability with criticality-based resource allocation and prefetching. [Citation Graph (, )][DBLP]


  45. Adaptive test elimination for analog/RF circuits. [Citation Graph (, )][DBLP]


  46. Lazy Error Detection for Microprocessor Functional Units. [Citation Graph (, )][DBLP]


  47. Digital calibration of RF transceivers for I-Q imbalances and nonlinearity. [Citation Graph (, )][DBLP]


  48. Efficient Testing of RF MIMO Transceivers Used in WLAN Applications. [Citation Graph (, )][DBLP]


  49. Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor. [Citation Graph (, )][DBLP]


  50. Dynamic test scheduling for analog circuits for improved test quality. [Citation Graph (, )][DBLP]


  51. Diagnosis of assembly failures for System-in-Package RF tuners. [Citation Graph (, )][DBLP]


  52. Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers. [Citation Graph (, )][DBLP]


  53. Defect filter for alternate RF test. [Citation Graph (, )][DBLP]


  54. Defect Filter for Alternate RF Test. [Citation Graph (, )][DBLP]


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